Patents by Inventor Christian Reuss

Christian Reuss has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230259106
    Abstract: Disclosed is a method for monitoring a production process using limit values for a technical parameter of units produced by the production process or for a technical parameter of the production process. The values of the technical parameter of units produced by a production process or of a technical parameter of a production process are distributed according to an underlying distribution. The distribution is characterized by an asymmetric probability density function (700) or by an asymmetric cumulative distribution function (CDF). The method comprises: comparing at least one value of the technical parameter with an interval that is asymmetric with regard to a characteristic value of the distribution, and monitoring the production process based on the result of the comparison.
    Type: Application
    Filed: July 7, 2021
    Publication date: August 17, 2023
    Inventors: Christian Weckbacher, Florian Knicker, Patric Ralph Stracke, Christian Reuss
  • Publication number: 20230043354
    Abstract: Disclosed is a method of determining at least one tolerance band limit value for a technical variable under test. The method includes obtaining the at least one tolerance band limit value from sample tolerance band limit values of different samples, wherein the samples comprise values of the technical variable under test of the associated sample, wherein obtaining the at least one tolerance band limit value comprises using a location measure of a distribution according to which the sample tolerance band limit values are distributed, wherein the technical variable under test is distributed according to an underlying extreme value distribution function, wherein each of the sample tolerance band limit values is calculable using a sample-specific conditional probability distribution function which is a function of sample values of the sample, and wherein the technical variable relates to a physical characteristic of a product that is producible in an industrial mass production process.
    Type: Application
    Filed: November 30, 2020
    Publication date: February 9, 2023
    Inventors: Florian Knicker, Patric Ralph Stracke, Christian Weckbacher, Christian Reuss
  • Publication number: 20220244713
    Abstract: Disclosed is a method for determining a limit, comprising: providing a plurality of sample values, wherein the sample values define a sample value distribution, the sample values being values of a technical parameter related to a sample, wherein the sample items are parts of drug delivery devices, wherein the sample items are of the same construction, and wherein the technical parameter is limited by at least one technical limit value, depending on the technical parameter and/or the sample values, choosing a probability distribution function, using the technical limit value to determine a cutoff value for the probability distribution function, specifying a probability content for the tolerance interval, and providing the limit of the tolerance interval for the technical parameter based on a transformed probability content, wherein said transformed probability content is based on the cutoff value and based on the specified probability content.
    Type: Application
    Filed: May 25, 2020
    Publication date: August 4, 2022
    Inventors: Florian Knicker, Christian Reuss, Christian Weckbacher, Patric Ralph Stracke