Abstract: The invention relates to a method for the sequential measurement of a plurality of semiconductor-based light sources such as LEDs, OLEDs or VCSELs, in particular comparatively low-luminosity light sources such as so-called micro-LEDs. The invention further relates to a device for carrying out the method. The object of the present invention is to provide a method that operates faster, more accurately and more sensitively than the known methods, which operate by scanning with a photodiode or with a spectrometer. The method according to the invention proposes for this that a current pulse is applied by means of a pulsed current source (1) to the low-luminosity light sources consecutively or simultaneously.