Patents by Inventor Christian Schleith

Christian Schleith has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12154260
    Abstract: A surface inspection system for capturing surface defects of a surface to be checked, includes a camera system, an illumination system including one or more light sources, and an evaluation system. The evaluation system evaluates a brightness and/or color distribution of the surface to be checked in at least one image captured by the camera system and captures surface defects of the surface to be checked as local deviations in the brightness and/or color. The evaluation system is configured to assess a local deviation in the brightness and/or color as a surface defect when the local deviation appears brighter in at least one first subregion and darker in at least one second subregion than a surface region surrounding the local deviation, and/or different colors are dominant in different subregions.
    Type: Grant
    Filed: June 28, 2023
    Date of Patent: November 26, 2024
    Assignee: Carl Zeiss Industrielle Messtechnik GmbH
    Inventors: Christian Schleith, Stefan Dieball, Béla Pontai
  • Publication number: 20240168369
    Abstract: A stripe projection system for three-dimensionally capturing the surface of a measurement object includes a projector configured to project a stripe pattern onto the measurement object and a digital camera for capturing the stripe pattern. The projector includes a binary amplitude mask having transparent and opaque regions. The amplitude mask has first stripe regions which extend in a first direction and in which the proportion of the opaque and of the transparent area proportions varies depending on a position in a second direction. In this case, it is provided that the first stripe regions each form a transition region between continuous opaque or transparent stripes extending in the first direction and alternate with these stripes in the second direction.
    Type: Application
    Filed: November 21, 2023
    Publication date: May 23, 2024
    Inventor: Christian Schleith
  • Publication number: 20230419471
    Abstract: A surface inspection system for capturing surface defects of a surface to be checked, includes a camera system, an illumination system including one or more light sources, and an evaluation system. The evaluation system evaluates a brightness and/or color distribution of the surface to be checked in at least one image captured by the camera system and captures surface defects of the surface to be checked as local deviations in the brightness and/or color. The evaluation system is configured to assess a local deviation in the brightness and/or color as a surface defect when the local deviation appears brighter in at least one first subregion and darker in at least one second subregion than a surface region surrounding the local deviation, and/or different colors are dominant in different subregions.
    Type: Application
    Filed: June 28, 2023
    Publication date: December 28, 2023
    Inventors: Christian Schleith, Stefan Dieball, Béla Pontai
  • Patent number: 10853971
    Abstract: A method for determining an exposure, in particular an exposure time, for a recording in a method for determining the 3D coordinates of an object is provided, in which a pattern is projected onto the object and the light reflected by the object is recorded. To improve such a method, a recording of the object is produced with a predetermined exposure, in particular exposure time. A mask image of this recording is produced, in which mask image the regions of the object lying within the measurement volume are depicted. The exposure, in particular the exposure time, for the recording is determined depending on the predetermined exposure, in particular exposure time, depending on the mean greyscale value in the regions, lying within the measurement volume, of the recording with a predetermined exposure and depending on an ideal greyscale value.
    Type: Grant
    Filed: February 1, 2018
    Date of Patent: December 1, 2020
    Assignee: Carl Zeiss Industrielle Messtechnik GmbH
    Inventors: Christian Schleith, Tom Jaeckel, Alexander Frey, Markus Basel
  • Publication number: 20180218517
    Abstract: A method for determining an exposure, in particular an exposure time, for a recording in a method for determining the 3D coordinates of an object is provided, in which a pattern is projected onto the object and the light reflected by the object is recorded. To improve such a method, a recording of the object is produced with a predetermined exposure, in particular exposure time. A mask image of this recording is produced, in which mask image the regions of the object lying within the measurement volume are depicted. The exposure, in particular the exposure time, for the recording is determined depending on the predetermined exposure, in particular exposure time, depending on the mean greyscale value in the regions, lying within the measurement volume, of the recording with a predetermined exposure and depending on an ideal greyscale value.
    Type: Application
    Filed: February 1, 2018
    Publication date: August 2, 2018
    Inventors: Christian Schleith, Tom Jaeckel, Alexander Frey, Markus Basel
  • Patent number: 9194810
    Abstract: A method serves the detection of surface defects of a component. The surface of the component (5) is radiated from the side with light from a light source (4, 4?). The light radiated back from the surface of the component (5) is detected by a sensor. To improve such a method, only a rear region (19, 19?) of the surface of the component (5) is radiated with light from the light source (4, 4?) and/or only the light radiated back from a rear region (19, 19?) of the surface of the component (5) is detected by the sensor and/or evaluated by an evaluation device FIG. 3).
    Type: Grant
    Filed: August 8, 2008
    Date of Patent: November 24, 2015
    Assignee: Steinbichler Optotechnik GmbH
    Inventors: Christian Schleith, Horst Winterberg, Marcus Steinbichler
  • Publication number: 20090079972
    Abstract: A method serves the detection of surface defects of a component. The surface of the component (5) is radiated from the side with light from a light source (4, 4?). The light radiated back from the surface of the component (5) is detected by a sensor. To improve such a method, only a rear region (19, 19?) of the surface of the component (5) is radiated with light from the light source (4, 4?) and/or only the light radiated back from a rear region (19, 19?) of the surface of the component (5) is detected by the sensor and/or evaluated by an evaluation device.
    Type: Application
    Filed: August 8, 2008
    Publication date: March 26, 2009
    Inventors: Christian Schleith, Horst Winterberg, Marcus Steinblichler