Abstract: An oblique plane microscope includes a detection optical unit having an image sensor which has a sensor surface formed from sensor lines arranged in parallel, and a transport optical unit having an objective arranged for specimen illumination by a light sheet tilted relative to an optical axis of the transport optical unit and for imaging a specimen plane illuminated with the light sheet onto the sensor surface. An optical axis of the detection optical unit is tilted relative to the optical axis of the transport optical unit. The sensor lines each extend in an orthogonal direction with respect to the optical axis of the transport optical unit. The detection optical unit has an anamorphic magnification system. A magnification of an anamorphic magnification system of the detection optical unit, in a direction lying orthogonal to the sensor lines, is less than in a direction lying parallel to the sensor lines.

Abstract: A light sheet microscope includes a sample chamber in which a cover slip or slide is arrangeable, which has a surface that defines a partially reflective interface and which has a further surface that defines a further partially reflective interface. The two interfaces are arranged at different distances from an objective. The light sheet microscope further includes an optical system having the objective facing toward the cover slip or slide, an illumination apparatus, which is designed to generate a light sheet, a sensor, and a processor. The two interfaces are formed in that two optical media are applicable in the sample chamber. The light sheet microscope forms a measuring device for acquiring a measured variable. The sensor is designed to acquire the intensities and/or the incidence locations of the two reflection light beams.

Abstract: A microscope includes: a motorized object stage for moving an object; an optical imaging system for forming an optical image of a plane (OE) in which the object is to be optically imaged; an optical scanning unit for moving the plane (OE) to be optically imaged by the optical imaging system relative to the optical imaging system; an image sensor for detecting the optical image of the plane (OE) formed by the optical imaging system; and a controller for controlling the motorized object stage and the optical scanning unit for simultaneously moving the object and the plane (OE) in a same direction relative to the optical imaging system while the optical image is being detected by the image sensor.

Abstract: A multispectral microscope system includes: a first detector element for capturing a first image of a sample in a first spectral channel; at least a second detector element for capturing a second image of the sample in a second spectral channel; and a processor for determining a spatial correlation between the first and second images based on a spectral crosstalk between the first and second spectral channels and registering the first and second images based on the spatial correlation.

Abstract: An optical imaging device for a microscope includes an objective and an optical system configured to interact with the objective for optically imaging an object selectively in a first operating mode and a second operating mode. The optical system includes a first optical subsystem associated with the first operating mode, and a second optical subsystem associated with the second operating mode. The first optical subsystem is configured to form a first image of the object with a first magnification. The second optical subsystem is configured to form a second image of the object with a second magnification that is less than the first magnification. The second optical subsystem includes an optical module insertable into the optical path for selecting the second operating mode. The optical module includes a lens element with a positive refractive power.

Abstract: A microscope includes an optical imaging system with an adjustable corrector, a microscope drive, a position sensitive detector, an optical measuring system and a control unit. The optical measuring system configured to form first and second measuring light beams, direct the measuring light beams into an entrance pupil of the optical imaging system eccentrically with first and second distances to the optical axis thereof, receive first and second reflection light beams, and direct the reflection light beams onto the position sensitive detector. The control unit is configured to record positions of the reflection light beams on the position sensitive detector, and determine an aberration based on the recorded positions.

Abstract: A changing system for a microscope includes multiple afocal enlargement changing modules of different enlargement levels that are optionally introducible into an infinite beam path running along an optical axis of the microscope. Each of the enlargement changing modules contain a light deflection system. The light deflection systems are designed to adjust the path length of the infinite beam path passing through the respective enlargement changing module in such a way that all of the enlargement changing modules, regardless of the different enlargement levels of the enlargement changing modules, map an exit pupil of a lens of the microscope onto the same location along the optical axis.

Abstract: A microscope is provided. The microscope includes a lens system comprising a lens unit, which is adjustable along an optical axis of the lens system to correct an imaging error. The microscope further includes a motor-actuatable adjustment device, which is configured to adjust the lens unit along the optical axis. The microscope also includes a processor and a scanning unit, which is configured to deflect a light beam used for the image recording. The processor is configured to compare a position of an image which has been recorded after a correction adjustment of the lens unit to reference data, detect a change of the position of the image due to the correction adjustment of the lens unit based on the comparison, and activate the scanning unit in such a way that the change of the position of the image is at least partially compensated for.

Abstract: A light sheet microscope includes a sample chamber in which a cover slip or slide is arrangeable, which has a surface that defines a partially reflective interface and which has a further surface that defines a further partially reflective interface. The two interfaces are arranged at different distances from an objective. The light sheet microscope further includes an optical system having the objective facing toward the cover slip or slide, an illumination apparatus, which is designed to generate a light sheet, a sensor, and a processor. The two interfaces are formed in that two optical media are applicable in the sample chamber. The light sheet microscope forms a measuring device for acquiring a measured variable. The sensor is designed to acquire the intensities and/or the incidence locations of the two reflection light beams.

Abstract: A device for receiving samples in a microscope is provided. The device comprises a microtiter plate. The microtiter plate comprises an inner part with cavities for the samples and with an optically transparent bottom plate, which seals the cavities underneath and a frame which defines a supporting surface and is configured to hold the inner part at least in a first position. The bottom plate is arranged above the supporting surface in the first position of the inner part. The inner part is movable relative to the frame along a direction (A) perpendicular to the supporting surface.

Abstract: A microscope system includes a light sheet microscopic functional unit that illuminates and images a sample in a first operating state with a light sheet-like illumination light distribution, and a scanning microscopic functional unit that illuminates and images the sample in a second operating state with a point-like illumination light distribution. A first scanning element uniaxially scans the sample, in the first operating state, with the light sheet-like illumination light distribution, and uniaxially scans the sample, in the second operating state, with the point-like illumination light distribution. A second scanning element uniaxially scans the sample, in the second operating state, with the point-like illumination light distribution, such that, in the second operating state, the second scanning element generates together with the first scanning element a biaxial scanning of the sample with the point-like illumination light distribution.

Abstract: A fan arrangement includes a fan and toothed ring, and a converter motor includes a fan arrangement. The fan includes a base body on which fan blades are premolded, and the fan includes an annular region, which is premolded on the side of the fan blades facing away from the base body. The toothed ring is situated within the annular region, and thus, in particular, is set apart from the base body, and thus, in particular, is set apart from the base body via the fan blades.

Abstract: An optical system for a microscope for imaging an object includes: a telescope system having an optical correction unit, which is adjustable in order to correct a spherical imaging aberration, and having a zoom optical unit, which is adjustable in order to adapt a magnification of the telescope system to a ratio of two refractive indices, one of which is assigned to an object side and an other of which is assigned to an image side, within a predetermined magnification range. The telescope system is telecentric over an entire magnification range both with respect to the object side and with respect to the image side by the zoom optical unit contained in the telescope system.

Abstract: A microscopic transmitted light contrasting method includes illuminating a sample through asymmetrical first and second illumination pupils and imaging the sample through asymmetrical first and second detection pupil in order to generate, respectively, first and second partial images. The first illumination pupil and the first detection pupil, as well as the second illumination pupil and the second detection pupil, are arranged pivoted in relation to one another and partially overlapping in projection on a plane perpendicular to an optical axis in such a way that first and third regions of an angular space are in a bright field and second and fourth regions of the angular space are in a dark field, and the first and second partial images each have a bright and a dark field component. An image of the sample is generated from the first and second partial images.

Abstract: A microscope includes: an optical system including an immersion objective for an immersion medium of a predetermined refractive index; an aperture stop; and a processor for setting an immersion-free imaging mode in which the optical system is operated without immersion medium. The processor controls the aperture stop in the immersion-free imaging mode to set a numerical aperture of the immersion objective to a reduced value which is lower than a nominal value of the numerical aperture, the numerical aperture being equal to the nominal value when the optical system is operated using the immersion medium without reducing the numerical aperture by the aperture stop. The processor controls the optical system in accordance with the reduced value of the numerical aperture in the immersion-free imaging mode to generate at least one image representing the overview image of the sample.

Abstract: A feed device for an immersion medium for use with an objective enabling a specimen to be imaged microscopically includes a cap fitted releasably or fixedly to the objective and delimiting a receptacle space for the immersion medium. The cap has an exit opening aligned with an optical element of the objective facing the specimen. The immersion medium held in the receptacle space is feedable through the exit opening to a target space situated between the optical element of the objective and the specimen. A sensor is integrated in the cap and has an electrode structure configured to detect an amount of the immersion medium fed through the exit opening to the target space. The electrode structure at least partly encloses the exit opening and has a spatial detection region extending away from the exit opening in a radial direction.

Abstract: A method is useable for digitally correcting an optical image of a sample by a microscope that has a cover slip covering the sample. The method includes: determining, by the microscope, an index of refraction of an optical medium bordering the cover slip, a tilt of the cover slip, and/or a thickness of the cover slip; ascertaining an imaging error to be corrected in the form of a pupil function based on the index of refraction of the optical medium, the tilt of the cover slip, and/or the thickness of the cover slip; carrying out imaging of the sample by the microscope; and digitally correcting image data captured by the imaging of the sample based on the pupil function.

Abstract: A changing system for a microscope includes multiple afocal enlargement changing modules of different enlargement levels that are optionally introducible into an infinite beam path running along an optical axis of the microscope. Each of the enlargement changing modules contain a light deflection system. The light deflection systems are designed to adjust the path length of the infinite beam path passing through the respective enlargement changing module in such a way that all of the enlargement changing modules, regardless of the different enlargement levels of the enlargement changing modules, map an exit pupil of a lens of the microscope onto the same location along the optical axis.

Abstract: A method is useable for determining a thickness of a cover slip or object carrier in a microscope, which has an objective facing toward a sample chamber. Two optical media border two opposing surfaces of the cover slip or object carrier and form two partially reflective interfaces, which are arranged at different distances from the objective. The method includes: deflecting a measurement light beam by the objective with oblique incidence on the cover slip or object carrier; generating two reflection light beams spatially separated from one another by the measurement light beam being partially reflected on each of the two interfaces; receiving the two reflection light beams by the objective and conducting them onto a position-sensitive detector; registering the incidence locations on the position-sensitive detector; and determining the thickness of the cover slip or object carrier based on the registered incidence locations.

Abstract: A method for correcting an imaging error in a microscope system, which has a microscope and an optical component, includes receiving at least one setting variable from a remote storage module via a data remote transmission network. The at least one setting variable is assigned to the imaging error and individual to the optical component. A correction element contained in the optical component is adjusted to correct the imaging error using the at least one setting variable.