Patents by Inventor Christian Stangier

Christian Stangier has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7571403
    Abstract: In one embodiment, a method for verifying one or more particular properties of a circuit using a learning strategy to determine suitable values of particular verification parameters includes classifying each of multiple properties of a circuit according to circuit size and selecting a candidate property from the properties. The candidate property set includes one or more particular properties from each property class. The method also includes attempting to verify one or more particular properties of the circuit using the candidate property set and particular values of particular verification parameters. The method also includes determining suitable values of the particular verification parameters according the attempted verification of the particular properties of the circuit using the candidate property set and the particular values of the particular verification parameters.
    Type: Grant
    Filed: April 10, 2006
    Date of Patent: August 4, 2009
    Assignee: Fujitsu Limited
    Inventors: Jawahar Jain, Subramanian K. Iyer, Amit Narayan, Debashis Sahoo, Christian Stangier
  • Patent number: 7360186
    Abstract: In one embodiment, a method for invariant checking includes executing one or more first steps of a finite state machine (FSM) corresponding to one or more binary decision diagrams (BDDs) to traverse a state space of the FSM in a first direction with respect to an initial state and an erroneous state.
    Type: Grant
    Filed: April 28, 2005
    Date of Patent: April 15, 2008
    Assignee: Fujitsu Limited
    Inventors: Thomas W. Sidle, Christian Stangier, Koichiro Takayama
  • Publication number: 20060173666
    Abstract: In one embodiment, a method for verifying one or more particular properties of a circuit using a learning strategy to determine suitable values of particular verification parameters includes classifying each of multiple properties of a circuit according to circuit size and selecting a candidate property from the properties. The candidate property set includes one or more particular properties from each property class. The method also includes attempting to verify one or more particular properties of the circuit using the candidate property set and particular values of particular verification parameters. The method also includes determining suitable values of the particular verification parameters according the attempted verification of the particular properties of the circuit using the candidate property set and the particular values of the particular verification parameters.
    Type: Application
    Filed: April 10, 2006
    Publication date: August 3, 2006
    Inventors: Jawahar Jain, Subramanian Iyer, Amit Narayan, Debashis Sahoo, Christian Stangier
  • Patent number: 7032197
    Abstract: A method for verifying a property associated with a target circuit is provided that includes receiving information associated with a target circuit, the information identifying a property within the target circuit to be verified. One or more operations may be executed in order to generate a set of transition relations for performing a reachability analysis associated with the target circuit. An image associated with the target circuit may be partitioned into a plurality of leaves that may each represent a subset of a final image to be generated by a partitioned ordered binary decision diagram (POBDD) data structure. An analysis may be computed of one or more of the leaves using a selected one or both of conjunction and quantification operations separately.
    Type: Grant
    Filed: June 4, 2003
    Date of Patent: April 18, 2006
    Assignee: Fujitsu Limited
    Inventors: Jawahar Jain, Subramanian K. Iyer, Amit Narayan, Debashis Sahoo, Christian Stangier
  • Patent number: 7028279
    Abstract: In one embodiment, a system for verifying a circuit using a scheduling technique includes one or more partitioned ordered binary decision diagram (POBDD) modules that collectively generate one or more POBDDs. Each POBDD corresponds to one or more partitions of a state space of the circuit and includes a number of states and a number of nodes in the partition. The system also includes one or more cost metrics modules that collectively determine a processing cost of each of the partitions of each of the POBDDs. The system also includes one or more scheduling modules that collectively schedule processing of the partitions of the POBDDs for semiformal verification of a circuit. The schedule is based, at least in part, on the determined processing costs of the partitions of the POBDDs.
    Type: Grant
    Filed: May 23, 2003
    Date of Patent: April 11, 2006
    Assignee: Fujitsu Limited
    Inventors: Jawahar Jain, Subramanian K. Iyer, Amit Narayan, Debashis Sahoo, Christian Stangier
  • Publication number: 20050278669
    Abstract: In one embodiment, a method for invariant checking includes executing one or more first steps of a finite state machine (FSM) corresponding to one or more binary decision diagrams (BDDs) to traverse a state space of the FSM in a first direction with respect to an initial state and an erroneous state.
    Type: Application
    Filed: April 28, 2005
    Publication date: December 15, 2005
    Inventors: Thomas Sidle, Christian Stangier, Koichiro Takayama
  • Publication number: 20040093571
    Abstract: In one embodiment, a system for verifying a circuit using a scheduling technique includes one or more partitioned ordered binary decision diagram (POBDD) modules that collectively generate one or more POBDDs. Each POBDD corresponds to one or more partitions of a state space of the circuit and includes a number of states and a number of nodes in the partition. The system also includes one or more cost metrics modules that collectively determine a processing cost of each of the partitions of each of the POBDDs. The system also includes one or more scheduling modules that collectively schedule processing of the partitions of the POBDDs for semiformal verification of a circuit. The schedule is based, at least in part, on the determined processing costs of the partitions of the POBDDs.
    Type: Application
    Filed: May 23, 2003
    Publication date: May 13, 2004
    Inventors: Jawahar Jain, Subramanian K. Iyer, Amit Narayan, Debashis Sahoo, Christian Stangier
  • Publication number: 20040093572
    Abstract: A method for verifying a property associated with a target circuit is provided that includes receiving information associated with a target circuit, the information identifying a property within the target circuit to be verified. One or more operations may be executed in order to generate a set of transition relations for performing a reachability analysis associated with the target circuit. An image associated with the target circuit may be partitioned into a plurality of leaves that may each represent a subset of a final image to be generated by a partitioned ordered binary decision diagram (POBDD) data structure. An analysis may be computed of one or more of the leaves using a selected one or both of conjunction and quantification operations separately.
    Type: Application
    Filed: June 4, 2003
    Publication date: May 13, 2004
    Applicant: Fujitsu Limited
    Inventors: Jawahar Jain, Subramanian K. Iyer, Amit Narayan, Debashis Sahoo, Christian Stangier