Abstract: System and method for measuring path loss of a conductive radio frequency (RF) signal path used in testing a RF data signal transceiver device under test (DUT) with a RF vector signal transceiver. A path loss measurement may be performed by initially leaving an open connection at the RF signal path end normally connected to the DUT during DUT testing. Sourcing the RF test signal with the RF vector signal transceiver at multiple test frequencies avoids need for additional testing with shorted and loaded connections at the RF signal path end.

Abstract: A system and method for using a wireless radio frequency (RF) data packet signaling link to enable non-link control of testing of a data packet signal transceiver device under test (DUT) in which a communication session between a tester and a DUT for purposes of testing the DUT may first be initiated by a separate, commonly available, and lower cost, communication device. Following its establishment, the tester may monitor the communication session, e.g., via wireless signal sniffing, to acquire and use associated device identification information to join the session and transmit trigger based test (TBT) data packets for initiating a test sequence within the DUT. Hence, use of a non-link capable tester to perform parametric testing of a DUT at the lowest network architecture layer, e.g., the physical (PHY) layer, may be enabled.

Abstract: Systems and methods are provided for systems and methods for using pulsed radio frequency (RF) signals to stimulate one or more modulated scattering probes (MSPs) to enable measurements of distance to and planarity of a surface of a wireless device under test (DUT).

Abstract: An example process determines a first error vector magnitude (EVM) of a signal output by a device under test (DUT). The process includes adding attenuation on a signal path between the DUT and a vector signal analyzer (VSA), where the attenuation is changeable: measuring, at the VSA, at least two second EVMs for different values of attenuation of the signal output by the DUT, where the at least two second EVMs are corrupted by noise from the VSA, and where each of the at least two second EVMs is based on two or more measurements; and determining the first EVM based on a linear relationship that is based on the first EVM, the at least two second EVMs, and a function based on the attenuation, where the first EVM is without at least some of the noise from the VSA.

Abstract: An example process determines a first error vector magnitude (EVM) of a signal output by a device under test (DUT). The process includes adding attenuation on a signal path between the DUT and a vector signal analyzer (VSA), where the attenuation is changeable: measuring, at the VSA, at least two second EVMs for different values of attenuation of the signal output by the DUT, where the at least two second EVMs are corrupted by noise from the VSA, and where each of the at least two second EVMs is based on two or more measurements; and determining the first EVM based on a linear relationship that is based on the first EVM, the at least two second EVMs, and a function based on the attenuation, where the first EVM is without at least some of the noise from the VSA.

Abstract: An example test system includes memory (e.g., one or more memory devices) storing (i) instructions that are executable, and (ii) a mapping function that relates first error vector magnitudes (EVMs) for first symbols to second EVMs for the first symbols, where the first EVMs are corrupted by radio frequency (RF) noise and the second EVMs are corrupted by both RF noise and symbol decoding errors. The test system also includes a decoder to receive a signal from a device under test, and to obtain a third EVM for a second symbol that is based on the signal, where the third EVM is corrupted by both RF noise and a symbol decoding error. One or more processing devices are configured to execute the instructions to adjust the third EVM using the mapping function to correct the symbol decoding error in the third EVM.

Abstract: Systems and methods are provided for systems and methods for using pulsed radio frequency (RF) signals to stimulate one or more modulated scattering probes (MSPs) to enable measurements of distance to and planarity of a surface of a wireless device under test (DUT).

Abstract: System and method for compensating for power loss due to a radio frequency (RF) signal probe mismatch in conductive RF signal testing of a RF data signal transceiver device under test (DUT). Sourcing the RF test signal with the RF vector signal transceiver at multiple test frequencies enables isolation of and compensation for power loss due to a mismatch between the RF signal probe and RF DUT connection based on predetermined losses of the RF signal path.

Abstract: System and method for measuring path loss of a conductive radio frequency (RF) signal path used in testing a RF data signal transceiver device under test (DUT) with a RF vector signal transceiver. A path loss measurement may be performed by initially leaving an open connection at the RF signal path end normally connected to the DUT during DUT testing. Sourcing the RF test signal with the RF vector signal transceiver at multiple test frequencies avoids need for additional testing with shorted and loaded connections at the RF signal path end.

Abstract: A system and method for using a wireless radio frequency (RF) data packet signaling link to enable non-link control of testing of a data packet signal transceiver device under test (DUT) in which a communication session between a tester and a DUT for purposes of testing the DUT may first be initiated by a separate, commonly available, and lower cost, communication device. Following its establishment, the tester may monitor the communication session, e.g., via wireless signal sniffing, to acquire and use associated device identification information to join the session and transmit trigger based test (TBT) data packets for initiating a test sequence within the DUT. Hence, use of a non-link capable tester to perform parametric testing of a DUT at the lowest network architecture layer, e.g., the physical (PHY) layer, may be enabled.

Abstract: System and method for testing a wireless data packet signal transceiver device under test (DUT) in which external control circuitry manages initiation of execution by a tester of test program instructions defining multiple self-terminating test control sequences in one or more desired sequences. The test control sequences may be pre-stored in a tester for subsequent execution under control of control signals sourced externally by the external control circuitry via separate control signals.

Abstract: System and method for testing a wireless signal transceiver device under test (DUT) via a wireless signal path using one or more electromagnetic lenses to provide one or more focused electromagnetic test signals to a quiet zone region enveloping at least a portion of the DUT.

Abstract: System and method for testing transmission and reception performance of a data packet signal transceiver device under test (DUT). Data packet signals transmitted by a tester with a tester transmit output power (TTOP) contain trigger frames that include data corresponding to a reported tester transmit power (RTTP) of the data packet signals, and a desired received signal strength (TRSS) of DUT data packet signals to be received by the tester. Based on received signal strength of the tester data packet signals reported by the DUT (DRSS), responsive DUT data packet signals having a DUT transmit output power of RTTP?DRSS+TRSS. Successive repetitions of such tester and DUT data packet signals for multiple combinations of values of the TTOP, RTTP and DRSS enable testing transmission and reception performance of the DUT, including determining minimum and maximum DUT transmission power levels, with minimal signal interactions between tester and DUT.

Abstract: System and method for testing transmission and reception performance of a data packet signal transceiver device under test (DUT). Data packet signals transmitted by a tester with a tester transmit output power (TTOP) contain trigger frames that include data corresponding to a reported tester transmit power (RTTP) of the data packet signals, and a desired received signal strength (TRSS) of DUT data packet signals to be received by the tester. Based on received signal strength of the tester data packet signals reported by the DUT (DRSS), responsive DUT data packet signals having a DUT transmit output power of RTTP-DRSS+TRSS. Successive repetitions of such tester and DUT data packet signals for multiple combinations of values of the TTOP, RTTP and DRSS enable testing transmission and reception performance of the DUT, including determining minimum and maximum DUT transmission power levels, with minimal signal interactions between tester and DUT.

Abstract: Method for testing a radio frequency (RF) data packet signal transceiver device under test (DUT) via a wireless signal medium that enables final functional testing of a fully assembled DUT without requiring wired signal connections. System performance characteristics indicative of manufacturing assembly defects, such as defective antennas or subsystem connections, can be performed using over the air (OTA) test signals communicated wirelessly between the DUT and a tester. By using actual DUT performance characteristics determined during earlier manufacturing tests, such as receiver sensitivity and transmitter power, and known power levels available from the tester transmitter, the OTA signal path loss (i.e., attenuation of the wireless signal) can be estimated and used to confirm the final state of system operation.

Abstract: System and method of testing performance of a data packet signal transceiver (DUT). Multiple DUT signals, with each having a respective DUT transmit power (RDTPn) received by the tester and corresponding to one (IDTPn) of multiple intended DUT transmit powers, for n=1, . . . , m, with a power equal to a minimum IDTP, maximum IDTP, or intermediate IDTP therebetween. Following association of each RDTPn with its IDTPn, a tester signal is sent having a trigger frame and tester transmit output power (TTOP). The trigger frame includes data corresponding to a reported tester transmit power (RTTP), and a desired signal strength (TRSS) of a DUT data packet signal to be received by the tester. A return DUT signal having a RDTPn is received, from which an IDTPn corresponding to the RDTPn is determined and compared to RTTP-TTOP+TRSS.

Abstract: A method for controlling block error rate (BLER) testing of a cellular communication device for a system having a fixed number of BLER data packets. Alternating sequences of downlink (DL) data packets have packet identifiers with a first state, and are separated by additional sequences of DL data packets having packet identifiers with a second state, thereby enabling control of BLER testing of the device to ensure a reliable accumulated count of DL data packets received by the device having packet identifiers only with the second state.

Abstract: A method for controlling block error rate (BLER) testing of a cellular communication device for a system having a fixed number of BLER data packets. Alternating sequences of downlink (DL) data packets have packet identifiers with first and second states, and are separated by additional sequences of DL data packets having packet identifiers with the first state, thereby enabling control of BLER testing of the device to ensure a reliable accumulated count of DL data packets received by the device having packet identifiers only with the second state.

Abstract: Systems and methods for detecting faulty elements in an active planar antenna array of an extremely high frequency (EHF) wireless communication device. A planar antenna array having a matrix of dual-polarization modulated scattering probes is disposed within a near-field region of the antenna under test (AUT). Electromagnetic energy received from the AUT is converted to a complex electrical signal that is modulated by an electrical modulation signal and radiated as a scattering signal. The resulting electromagnetic scattering signal, received and converted to an electrical signal by another antenna, is used in a holographic image reconstruction operation via a backward-propagation transformation to reconstruct the signal spectrum radiated from the surface of the AUT. A comparison of this reconstructed signal spectrum with a reference signal spectrum radiated from the surface of a known good antenna array enables detection of faulty antenna elements within the AUT.

Abstract: Systems and methods for detecting faulty elements in an active planar antenna array of an extremely high frequency (EHF) wireless communication device. A planar antenna array having a matrix of dual-polarization modulated scattering probes is disposed within a near-field region of the antenna under test (AUT). Electromagnetic energy received from the AUT is converted to a complex electrical signal that is modulated by an electrical modulation signal and radiated as a scattering signal. The resulting electromagnetic scattering signal, received and converted to an electrical signal by another antenna, is used in a holographic image reconstruction operation via a backward-propagation transformation to reconstruct the signal spectrum radiated from the surface of the AUT. A comparison of this reconstructed signal spectrum with a reference signal spectrum radiated from the surface of a known good antenna array enables detection of faulty antenna elements within the AUT.