Patents by Inventor Christian Volf Olgaard

Christian Volf Olgaard has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240430185
    Abstract: An example system includes a signal generator to output signals based on multiple carrier frequencies; a wired transmission medium for carrying the signals, where the wired transmission medium is configured as open ended to produce reflections on the wired transmission medium of the signals; and a signal analyzer to receive the reflections and to determine a transmission time of a signal along the wired transmission medium based on the reflections. The signal analyzer is configured to perform operations that include performing a search based on an estimated transmission time of the signal along the wired transmission medium and the reflections to determine the transmission time. The search is to determine which of multiple candidate transmission times to select for the transmission time.
    Type: Application
    Filed: June 30, 2023
    Publication date: December 26, 2024
    Inventors: Chen CAO, Christian Volf Olgaard, Ruizu Wang, Qingjie Lu
  • Publication number: 20240361376
    Abstract: An example method includes the following operations: (i) receiving a device signal from a device under test (DUT); (ii) setting an attenuation value; (iii) applying the attenuation value to the device signal to produce an attenuated device signal for a frequency spectrum analyzing device, where the frequency spectrum analyzing device produces a noise signal; (iv) obtaining a power spectral density value using the frequency spectrum analyzing device, where a power spectral density comprises a power, at a frequency value, of a combined signal that is based on the attenuated device signal and the noise signal; (v) repeating operations (ii), (iii), and (iv) one or more times to produce multiple power spectral density values; (vi) repeating operations (i), (ii), (iii), (iv), and (v) one or more times to add power spectral density values to the multiple power spectral density values; and (vii) obtaining a power spectral density of the device signal.
    Type: Application
    Filed: May 5, 2023
    Publication date: October 31, 2024
    Inventors: Chen Cao, Christian Volf Olgaard, Ruizu Wang, Qingjie Lu
  • Publication number: 20240361367
    Abstract: An example method includes following operations: (i) receiving a device signal from a device under test (DUT); (ii) setting an attenuation value; (iii) applying the attenuation value to the device signal to produce an attenuated device signal for a frequency spectrum analyzing device, where the frequency spectrum analyzing device produces a noise signal and intermodulation interference; (iv) obtaining a power spectral density value, where the power spectral density value comprises a power, at a frequency value, of a combined signal that is based on the attenuated device signal, the noise signal, and the intermodulation interference; (v) repeating operations (ii), (iii), and (iv) one or more times to produce multiple power spectral density values; (vi) repeating operations (i), (ii), (iii), (iv), and (v) one or more times to add power spectral density values to the multiple power spectral density values; and (vii) obtaining a power spectral density of the device signal.
    Type: Application
    Filed: May 5, 2023
    Publication date: October 31, 2024
    Inventors: Chen CAO, Christian Volf Olgaard, Ruizu Wang, Qingjie Lu
  • Patent number: 11855707
    Abstract: System and method for measuring path loss of a conductive radio frequency (RF) signal path used in testing a RF data signal transceiver device under test (DUT) with a RF vector signal transceiver. A path loss measurement may be performed by initially leaving an open connection at the RF signal path end normally connected to the DUT during DUT testing. Sourcing the RF test signal with the RF vector signal transceiver at multiple test frequencies avoids need for additional testing with shorted and loaded connections at the RF signal path end.
    Type: Grant
    Filed: June 21, 2021
    Date of Patent: December 26, 2023
    Assignee: LITEPOINT CORPORATION
    Inventors: Chen Cao, Christian Volf Olgaard, Ray Wang
  • Patent number: 11835563
    Abstract: Systems and methods are provided for systems and methods for using pulsed radio frequency (RF) signals to stimulate one or more modulated scattering probes (MSPs) to enable measurements of distance to and planarity of a surface of a wireless device under test (DUT).
    Type: Grant
    Filed: February 15, 2022
    Date of Patent: December 5, 2023
    Assignee: LITEPOINT CORPORATION
    Inventors: Minh-Chau Huynh, Morten Damgaard, Christian Volf Olgaard
  • Patent number: 11838776
    Abstract: A system and method for using a wireless radio frequency (RF) data packet signaling link to enable non-link control of testing of a data packet signal transceiver device under test (DUT) in which a communication session between a tester and a DUT for purposes of testing the DUT may first be initiated by a separate, commonly available, and lower cost, communication device. Following its establishment, the tester may monitor the communication session, e.g., via wireless signal sniffing, to acquire and use associated device identification information to join the session and transmit trigger based test (TBT) data packets for initiating a test sequence within the DUT. Hence, use of a non-link capable tester to perform parametric testing of a DUT at the lowest network architecture layer, e.g., the physical (PHY) layer, may be enabled.
    Type: Grant
    Filed: October 23, 2020
    Date of Patent: December 5, 2023
    Assignee: Litepoint Corporation
    Inventors: Christian Volf Olgaard, Ruizu Wang, Chen Cao
  • Publication number: 20230370172
    Abstract: An example process determines a first error vector magnitude (EVM) of a signal output by a device under test (DUT). The process includes adding attenuation on a signal path between the DUT and a vector signal analyzer (VSA), where the attenuation is changeable: measuring, at the VSA, at least two second EVMs for different values of attenuation of the signal output by the DUT, where the at least two second EVMs are corrupted by noise from the VSA, and where each of the at least two second EVMs is based on two or more measurements; and determining the first EVM based on a linear relationship that is based on the first EVM, the at least two second EVMs, and a function based on the attenuation, where the first EVM is without at least some of the noise from the VSA.
    Type: Application
    Filed: May 17, 2022
    Publication date: November 16, 2023
    Inventors: Chen CAO, Christian Volf OLGAARD, Ruizu WANG, Qingjie LU
  • Patent number: 11817913
    Abstract: An example process determines a first error vector magnitude (EVM) of a signal output by a device under test (DUT). The process includes adding attenuation on a signal path between the DUT and a vector signal analyzer (VSA), where the attenuation is changeable: measuring, at the VSA, at least two second EVMs for different values of attenuation of the signal output by the DUT, where the at least two second EVMs are corrupted by noise from the VSA, and where each of the at least two second EVMs is based on two or more measurements; and determining the first EVM based on a linear relationship that is based on the first EVM, the at least two second EVMs, and a function based on the attenuation, where the first EVM is without at least some of the noise from the VSA.
    Type: Grant
    Filed: May 17, 2022
    Date of Patent: November 14, 2023
    Assignee: LITEPOINT CORPORATION
    Inventors: Chen Cao, Christian Volf Olgaard, Ruizu Wang, Qingjie Lu
  • Patent number: 11742970
    Abstract: An example test system includes memory (e.g., one or more memory devices) storing (i) instructions that are executable, and (ii) a mapping function that relates first error vector magnitudes (EVMs) for first symbols to second EVMs for the first symbols, where the first EVMs are corrupted by radio frequency (RF) noise and the second EVMs are corrupted by both RF noise and symbol decoding errors. The test system also includes a decoder to receive a signal from a device under test, and to obtain a third EVM for a second symbol that is based on the signal, where the third EVM is corrupted by both RF noise and a symbol decoding error. One or more processing devices are configured to execute the instructions to adjust the third EVM using the mapping function to correct the symbol decoding error in the third EVM.
    Type: Grant
    Filed: July 28, 2022
    Date of Patent: August 29, 2023
    Assignee: LITEPOINT CORPORATION
    Inventors: Chen Cao, Christian Volf Olgaard, Ruizu Wang, Qingjie Lu
  • Publication number: 20230258702
    Abstract: Systems and methods are provided for systems and methods for using pulsed radio frequency (RF) signals to stimulate one or more modulated scattering probes (MSPs) to enable measurements of distance to and planarity of a surface of a wireless device under test (DUT).
    Type: Application
    Filed: February 15, 2022
    Publication date: August 17, 2023
    Inventors: Minh-Chau Huynh, Morten Damgaard, Christian Volf Olgaard
  • Patent number: 11598803
    Abstract: System and method for compensating for power loss due to a radio frequency (RF) signal probe mismatch in conductive RF signal testing of a RF data signal transceiver device under test (DUT). Sourcing the RF test signal with the RF vector signal transceiver at multiple test frequencies enables isolation of and compensation for power loss due to a mismatch between the RF signal probe and RF DUT connection based on predetermined losses of the RF signal path.
    Type: Grant
    Filed: June 21, 2021
    Date of Patent: March 7, 2023
    Assignee: LITEPOINT CORPORATION
    Inventors: Chen Cao, Christian Volf Olgaard, Ray Wang
  • Publication number: 20220407610
    Abstract: System and method for measuring path loss of a conductive radio frequency (RF) signal path used in testing a RF data signal transceiver device under test (DUT) with a RF vector signal transceiver. A path loss measurement may be performed by initially leaving an open connection at the RF signal path end normally connected to the DUT during DUT testing. Sourcing the RF test signal with the RF vector signal transceiver at multiple test frequencies avoids need for additional testing with shorted and loaded connections at the RF signal path end.
    Type: Application
    Filed: June 21, 2021
    Publication date: December 22, 2022
    Inventors: Chen Cao, Christian Volf Olgaard, Ray Wang
  • Publication number: 20220132340
    Abstract: A system and method for using a wireless radio frequency (RF) data packet signaling link to enable non-link control of testing of a data packet signal transceiver device under test (DUT) in which a communication session between a tester and a DUT for purposes of testing the DUT may first be initiated by a separate, commonly available, and lower cost, communication device. Following its establishment, the tester may monitor the communication session, e.g., via wireless signal sniffing, to acquire and use associated device identification information to join the session and transmit trigger based test (TBT) data packets for initiating a test sequence within the DUT. Hence, use of a non-link capable tester to perform parametric testing of a DUT at the lowest network architecture layer, e.g., the physical (PHY) layer, may be enabled.
    Type: Application
    Filed: October 23, 2020
    Publication date: April 28, 2022
    Inventors: Christian Volf Olgaard, Ruizu Wang, Chen Cao
  • Patent number: 11032725
    Abstract: System and method for testing a wireless data packet signal transceiver device under test (DUT) in which external control circuitry manages initiation of execution by a tester of test program instructions defining multiple self-terminating test control sequences in one or more desired sequences. The test control sequences may be pre-stored in a tester for subsequent execution under control of control signals sourced externally by the external control circuitry via separate control signals.
    Type: Grant
    Filed: March 18, 2020
    Date of Patent: June 8, 2021
    Assignee: LITEPOINT CORPORATION
    Inventors: Christian Volf Olgaard, Ruizu Wang, Chen Cao
  • Publication number: 20200358538
    Abstract: System and method for testing a wireless signal transceiver device under test (DUT) via a wireless signal path using one or more electromagnetic lenses to provide one or more focused electromagnetic test signals to a quiet zone region enveloping at least a portion of the DUT.
    Type: Application
    Filed: May 9, 2019
    Publication date: November 12, 2020
    Inventors: Christian Volf Olgaard, Brad Robbins, Yen-Fang Chao
  • Patent number: 10819616
    Abstract: System and method for testing transmission and reception performance of a data packet signal transceiver device under test (DUT). Data packet signals transmitted by a tester with a tester transmit output power (TTOP) contain trigger frames that include data corresponding to a reported tester transmit power (RTTP) of the data packet signals, and a desired received signal strength (TRSS) of DUT data packet signals to be received by the tester. Based on received signal strength of the tester data packet signals reported by the DUT (DRSS), responsive DUT data packet signals having a DUT transmit output power of RTTP?DRSS+TRSS. Successive repetitions of such tester and DUT data packet signals for multiple combinations of values of the TTOP, RTTP and DRSS enable testing transmission and reception performance of the DUT, including determining minimum and maximum DUT transmission power levels, with minimal signal interactions between tester and DUT.
    Type: Grant
    Filed: January 15, 2019
    Date of Patent: October 27, 2020
    Assignee: LitePoint Corporation
    Inventors: Christian Volf Olgaard, Ruizu Wang, Kaiyun Cui
  • Publication number: 20200228434
    Abstract: System and method for testing transmission and reception performance of a data packet signal transceiver device under test (DUT). Data packet signals transmitted by a tester with a tester transmit output power (TTOP) contain trigger frames that include data corresponding to a reported tester transmit power (RTTP) of the data packet signals, and a desired received signal strength (TRSS) of DUT data packet signals to be received by the tester. Based on received signal strength of the tester data packet signals reported by the DUT (DRSS), responsive DUT data packet signals having a DUT transmit output power of RTTP-DRSS+TRSS. Successive repetitions of such tester and DUT data packet signals for multiple combinations of values of the TTOP, RTTP and DRSS enable testing transmission and reception performance of the DUT, including determining minimum and maximum DUT transmission power levels, with minimal signal interactions between tester and DUT.
    Type: Application
    Filed: January 15, 2019
    Publication date: July 16, 2020
    Inventors: Christian Volf Olgaard, Ruizu Wang, Kaiyun Cui
  • Patent number: 10666538
    Abstract: Method for testing a radio frequency (RF) data packet signal transceiver device under test (DUT) via a wireless signal medium that enables final functional testing of a fully assembled DUT without requiring wired signal connections. System performance characteristics indicative of manufacturing assembly defects, such as defective antennas or subsystem connections, can be performed using over the air (OTA) test signals communicated wirelessly between the DUT and a tester. By using actual DUT performance characteristics determined during earlier manufacturing tests, such as receiver sensitivity and transmitter power, and known power levels available from the tester transmitter, the OTA signal path loss (i.e., attenuation of the wireless signal) can be estimated and used to confirm the final state of system operation.
    Type: Grant
    Filed: May 26, 2015
    Date of Patent: May 26, 2020
    Assignee: LITEPOINT CORPORATION
    Inventor: Christian Volf Olgaard
  • Patent number: 10666542
    Abstract: System and method of testing performance of a data packet signal transceiver (DUT). Multiple DUT signals, with each having a respective DUT transmit power (RDTPn) received by the tester and corresponding to one (IDTPn) of multiple intended DUT transmit powers, for n=1, . . . , m, with a power equal to a minimum IDTP, maximum IDTP, or intermediate IDTP therebetween. Following association of each RDTPn with its IDTPn, a tester signal is sent having a trigger frame and tester transmit output power (TTOP). The trigger frame includes data corresponding to a reported tester transmit power (RTTP), and a desired signal strength (TRSS) of a DUT data packet signal to be received by the tester. A return DUT signal having a RDTPn is received, from which an IDTPn corresponding to the RDTPn is determined and compared to RTTP-TTOP+TRSS.
    Type: Grant
    Filed: January 15, 2019
    Date of Patent: May 26, 2020
    Assignee: LITEPOINT CORPORATION
    Inventors: Christian Volf Olgaard, Ruizu Wang
  • Publication number: 20200119862
    Abstract: A method for controlling block error rate (BLER) testing of a cellular communication device for a system having a fixed number of BLER data packets. Alternating sequences of downlink (DL) data packets have packet identifiers with a first state, and are separated by additional sequences of DL data packets having packet identifiers with a second state, thereby enabling control of BLER testing of the device to ensure a reliable accumulated count of DL data packets received by the device having packet identifiers only with the second state.
    Type: Application
    Filed: October 11, 2018
    Publication date: April 16, 2020
    Inventors: Christian Volf Olgaard, Chen Cao, Ruizu Wang, Yachao Ding