Patents by Inventor Christian Warling

Christian Warling has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9377506
    Abstract: A system, method, and tangible computer readable medium for chip debug is disclosed. For example, the system can include a plurality of functional blocks, a debug path, and a debug bus steering module. The debug path couples the plurality of functional blocks in a daisy chain configuration, where an end functional block from the plurality of functional blocks is at an end of the daisy chain configuration. The debug bus steering module is configured to pass one or more debug signals associated with a first functional block from the plurality of functional blocks along the debug path to the end functional block while a second functional block from the plurality of functional blocks performs one or more power gating cycles.
    Type: Grant
    Filed: March 31, 2014
    Date of Patent: June 28, 2016
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Shantanu Sarangi, Nehal Patel, Christian Warling
  • Patent number: 9329963
    Abstract: Methods and apparatus are provided that facilitate debugging operations for components that may include different power domains. In an embodiment, an integrated circuit (IC) includes a plurality of hardware sectors, each hardware sector associated with a debug observability circuit that is served by a debug data bus of a debug circuit. The plurality of hardware sectors includes a controlled sector residing in a dynamically-controlled power domain that may be turned off while the power domain of another sector remains on. A selectively switchable data bus component is configured to couple the debug observability circuit associated with the controlled sector to the debug data bus when the power to the controlled sector is on and to switch to bypass the debug observability circuit associated with the controlled sector when the power to the controlled sector is not on.
    Type: Grant
    Filed: September 16, 2013
    Date of Patent: May 3, 2016
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Shantanu K. Sarangi, Christian Warling, Eric Rentschler, Vikram Chopra, Mihir Doctor
  • Publication number: 20150276868
    Abstract: A system, method, and tangible computer readable medium for chip debug is disclosed. For example, the system can include a plurality of functional blocks, a debug path, and a debug bus steering module. The debug path couples the plurality of functional blocks in a daisy chain configuration, where an end functional block from the plurality of functional blocks is at an end of the daisy chain configuration. The debug bus steering module is configured to pass one or more debug signals associated with a first functional block from the plurality of functional blocks along the debug path to the end functional block while a second functional block from the plurality of functional blocks performs one or more power gating cycles.
    Type: Application
    Filed: March 31, 2014
    Publication date: October 1, 2015
    Applicant: Advanced Micro Devices, Inc.
    Inventors: Shantanu SARANGI, Nehal Patel, Christian Warling
  • Publication number: 20150082092
    Abstract: Methods and apparatus are provided that facilitate debugging operations for components that may include different power domains. In an embodiment, an integrated circuit (IC) includes a plurality of hardware sectors, each hardware sector associated with a debug observability circuit that is served by a debug data bus of a debug circuit. The plurality of hardware sectors includes a controlled sector residing in a dynamically-controlled power domain that may be turned off while the power domain of another sector remains on. A selectively switchable data bus component is configured to couple the debug observability circuit associated with the controlled sector to the debug data bus when the power to the controlled sector is on and to switch to bypass the debug observability circuit associated with the controlled sector when the power to the controlled sector is not on.
    Type: Application
    Filed: September 16, 2013
    Publication date: March 19, 2015
    Applicant: Advanced Micro Devices, Inc.
    Inventors: Shantanu K. Sarangi, Christian Warling, Eric Rentschler, Vikram Chopra, Mihir Doctor
  • Patent number: 6275501
    Abstract: A network node includes a serial physical sublayer (PHY) chip, a parallel PHY chip, and a media access control (MAC) chip. The serial physical sublayer chip, includes a single bit transmit data input, a single bit receive data output, and serial PHY control signal input/output (I/O) lines. The parallel PHY chip includes a multi-bit transmit data input, a multi-bit receive data output, and parallel PHY control signal I/O lines. The MAC chip includes a multi-bit transmit data output, a multi-bit receive data input and parallel control signal I/O lines. The multi-bit transmit data output is connected to the multi-bit transmit data input. One bit of the multi-bit transmit data output is connected to the single bit transmit data input. The multi-bit receive data input is connected to the multi-bit receive data output. One bit of the multi-bit receive data input is connected to the single bit receive data output. The parallel control signal I/O lines are connected to the parallel PHY control signal I/O lines.
    Type: Grant
    Filed: April 21, 1998
    Date of Patent: August 14, 2001
    Assignee: Hewlett-Packard Company
    Inventors: Mark C. Lucas, Eric McLaughlin, Christian Warling