Patents by Inventor Christie Enke

Christie Enke has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11127580
    Abstract: A detector system for targeted analysis and/or sample collection by distance-of-flight mass spectrometry (tDOF-MS).
    Type: Grant
    Filed: November 16, 2018
    Date of Patent: September 21, 2021
    Assignee: UNM Rainforest Innovations
    Inventor: Christie Enke
  • Publication number: 20200357624
    Abstract: A detector system for targeted analysis and/or sample collection by distance-of-flight mass spectrometry (tDOF-MS).
    Type: Application
    Filed: November 16, 2018
    Publication date: November 12, 2020
    Applicant: STC.UNM
    Inventor: Christie Enke
  • Patent number: 8378296
    Abstract: Methods and instruments for high dynamic range analysis of sample components are described. A sample is subjected to time-dependent separation, ionized, and the ions dispersed with a constant integration time across an array of detectors according to the ions m/z values. Each of the detectors in the array has a dynamically adjustable gain or a logarithmic response function, producing an instrument capable of detecting a ratio of responses or 4 or more orders of magnitude.
    Type: Grant
    Filed: April 5, 2011
    Date of Patent: February 19, 2013
    Assignee: STC.UNM
    Inventor: Christie Enke
  • Publication number: 20080017792
    Abstract: A distance-of-flight mass spectrometer (DOF-MS) imparts constant momentum acceleration to ions in an ion source and uses an ion mirror to enhance energy focusing. Embodiments of DOF-MS with ion mirror are shown. Further, a method of compensating for the dispersion of initial ion position and velocity in the ion source is discussed.
    Type: Application
    Filed: October 2, 2007
    Publication date: January 24, 2008
    Applicant: STC.UNM
    Inventors: Christie Enke, Gareth Dobson
  • Publication number: 20060138318
    Abstract: A distance of flight (DOF) approach to mass spectroscopy in which the resolution among the various ion masses is accomplished in space rather than time. A separate detector is associated with each ion mass resolution element. The DOF mass spectrometer can serve as one element in a tandem arrangement which has the capability to produce a full two-dimensional precursor/product spectrum for each bunch of ions extracted from the source. A “distance-of-flight” (DOF) mass analyzer is used in combination with time-of-flight (TOF) mass analysis for precursor and product dispersion. All the precursor ions can undergo a mass changing reaction simultaneously, while still retaining the essential information about the particular precursor m/z value from which each product ion m/z value emanated. Through the use of a two-dimensional detector, all the products ions from all the precursors can be detected for each batch of ions analyzed.
    Type: Application
    Filed: February 23, 2006
    Publication date: June 29, 2006
    Applicant: SCIENCE & TECHNOLOGY CORPORATION @ UNM
    Inventor: Christie Enke
  • Publication number: 20050040326
    Abstract: A distance of flight (DOF) approach to mass spectroscopy in which the resolution among the various ion masses is accomplished in space rather than time. A separate detector is associated with each ion mass resolution element. The DOF mass spectrometer can serve as one element in a tandem arrangement which has the capability to produce a full two-dimensional precursor/product spectrum for each bunch of ions extracted from the source. A “distance-of-flight” (DOF) mass analyzer is used in combination with time-of-flight (TOF) mass analysis for precursor and product dispersion. All the precursor ions can undergo a mass changing reaction simultaneously, while still retaining the essential information about the particular precursor m/z value from which each product ion m/z value emanated. Through the use of a two-dimensional detector, all the products ions from all the precursors can be detected for each batch of ions analyzed.
    Type: Application
    Filed: March 18, 2004
    Publication date: February 24, 2005
    Applicant: SCIENCE & TECHNOLOGY CORPORATION @ UNM
    Inventor: Christie Enke