Patents by Inventor Christinus A. P. Van Liempd

Christinus A. P. Van Liempd has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • X-ray measurement apparatus for the measurement of x-ray doses and acceleration voltage
    Patent number: 5081664
    Abstract: A compact X-ray measurement apparatus is realized for dose as well as energy measurements by using an X-ray detector comprising scintillation crystals coupled to photodiodes. To this end, the current generated by the photodiodes is periodically applied to an integrator and the photodiode is charged across its intrinsic capacitance during sampling and reset periods of the integrator. Loss of charge is thus avoided and a low X-ray dose can be measured. The X-ray measurement apparatus can be calibrated by calibration of the photodiodes.
    Type: Grant
    Filed: April 24, 1990
    Date of Patent: January 14, 1992
    Assignee: U.S. Philips Corporation
    Inventors: Ging H. Lie, Christinus A. P. Van Liempd, Franciscus Schmal, Erik Sies