Patents by Inventor Christoper Magg

Christoper Magg has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Mask program defect test
    Patent number: 8538129
    Abstract: A method for characterizing the resolution of mask inspection tool using a test mask and a database containing defect data. A variety of defect types and sizes is programmed into the database, and the database is then used to inspect the defect-free mask. All defects programmed into the database are not captured in performing the method, so the resolution capability of an inspection tool can be determined.
    Type: Grant
    Filed: October 9, 2009
    Date of Patent: September 17, 2013
    Assignee: International Business Machines Corporation
    Inventors: Karen D. Badger, Emily E Gallagher, Christoper Magg