Patents by Inventor Christoph Jens Wienken

Christoph Jens Wienken has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and device for particle analysis using thermophoresis
    Patent number: 8941080
    Abstract: The present invention pertains to a device and method to measure thermo-optical, preferably thermophoretic, characteristics of particles in a solution. The method comprises the steps of: (a) providing a sample probe comprising marked particles in a solution; (b) providing a temperature control system for creating a temperature gradient within said sample probe by contact heating, electrical heating and/or cooling; (c) detecting the marked particles at a first time; (d) creating a temperature gradient within the sample probe by means of the temperature control system; (e) detecting the marked particles in the sample probe at a, preferably predetermined, second time and/or at a predetermined location within the temperature gradient, and (f) characterizing the particles based on said two detections.
    Type: Grant
    Filed: May 20, 2009
    Date of Patent: January 27, 2015
    Assignee: Ludwig-Maximilians-Universitat Munchen
    Inventors: Stefan Duhr, Philipp Baaske, Dieter Braun, Christoph Jens Wienken
  • METHOD AND DEVICE FOR PARTICLE ANALYSIS USING THERMOPHORESIS
    Publication number: 20110084218
    Abstract: The present invention pertains to a device and method to measure thermo-optical, preferably thermophoretic, characteristics of particles in a solution. The method comprises the steps of: (a) providing a sample probe comprising marked particles in a solution; (b) providing a temperature control system for creating a temperature gradient within said sample probe by contact heating, electrical heating and/or cooling; (c) detecting the marked particles at a first time; (d) creating a temperature gradient within the sample probe by means of the temperature control system; (e) detecting the marked particles in the sample probe at a, preferably predetermined, second time and/or at a predetermined location within the temperature gradient, and (f) characterizing the particles based on said two detections.
    Type: Application
    Filed: May 20, 2009
    Publication date: April 14, 2011
    Inventors: Stefan Duhr, Philipp Baaske, Dieter Braun, Christoph Jens Wienken