Abstract: A method for testing electronic devices, and to a test device that is, for test purposes, configured to be connected to an electronic system instead of an electronic device is disclosed. In one embodiment, the device includes at least one means for supplying a signal supplied by the electronic system and destined, in normal operation of the electronic system, for the electronic device, to a first electronic device that is configured to be connected to the device, and at least one further means for supplying a further signal supplied by the electronic system and destined, in normal operation of the electronic system, for the electronic device, to a second electronic device that is adapted to be connected to the device.

Abstract: A testing system for testing semiconductor devices, in particular for testing the functioning of BGA semi-conductor devices incorporated in a semiconductor module, comprising an analyzer and at least one measuring adaptor for establishing the electric connections between the analyzer and the semiconductor device, wherein the measuring adaptor comprises a region with electric contact points via which electric pins of the semiconductor device can be contacted, and at least one electric coupling via which the measuring adaptor can be connected to the analyzer, wherein the electric contact points and the electric coupling of the measuring adaptor are connected with each other via at least one flexible flat cable.