Patents by Inventor Christoph Wolfgang Marquardt

Christoph Wolfgang Marquardt has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9709487
    Abstract: A method for measuring the concentration of a gas component in a measuring gas. An absorption line of the gas component is varied as a function of the wavelength of the light of a wavelength-tunable light source within a periodically sequential scanning interval. The absorption line of the gas component is modulated with a frequency (f0). Modulated light is guided through the measuring gas onto a detector. A measurement signal generated by the detector is demodulated upon determining a harmonic (nf0) of the frequency (f0). A measurement result is produced by fitting a setpoint curve to the profile of the demodulated measurement signal. Both demodulated measurement signal and setpoint cure are filtered with the aid of the same filter function. The filter function is operative to suppress noise signal components of the demodulated measurement signal that disturb both signal components of the demodulated measurement signal and the setpoint curve.
    Type: Grant
    Filed: January 21, 2015
    Date of Patent: July 18, 2017
    Assignee: Siemens Aktiengesellschaft
    Inventors: Ralf Bitter, Thomas Hankiewicz, Christoph Wolfgang Marquardt, Adrian Mucha, Jan Nygren, Kai-Uwe Pleban, Franz Steinbacher
  • Patent number: 9546989
    Abstract: A method for measuring the concentration of a gas component in a measurement gas using a gas analyzer comprises varying the wavelength of the light of a wavelength-tunable light source within periodically consecutive scan intervals for wavelength-dependent scanning of a gas component absorption line of interest. The method also comprises modulating the wavelength of the light of the wavelength-tunable light source with a frequency, guiding the modulated light through the measurement gas onto a detector and demodulating a measurement signal generated by the detector in the event of a harmonic of the frequency. The method further comprises producing a measurement result by fitting a desired curve to the profile of the demodulated measurement signal. A function orthogonal to the desired curve is provided, and an orthogonal component of the measurement result is produced by fitting the orthogonal function to the profile of the demodulated measurement signal.
    Type: Grant
    Filed: October 1, 2014
    Date of Patent: January 17, 2017
    Assignee: Siemens Aktiengesellschaft
    Inventors: Ralf Bitter, Thomas Hankiewicz, Christoph Wolfgang Marquardt, Jan Nygren, Kai-Uwe Pleban, Franz Steinbacher
  • Publication number: 20150204779
    Abstract: A method for measuring the concentration of a gas component in a measuring gas. An absorption line of the gas component is varied as a function of the wavelength of the light of a wavelength-tunable light source within a periodically sequential scanning interval. The absorption line of the gas component is modulated with a frequency (f0) Modulated light is guided through the measuring gas onto a detector. A measurement signal generated by the detector is demodulated upon determining a harmonic (nf0) of the frequency (f0). A measurement result is produced by fitting a setpoint curve to the profile of the demodulated measurement signal. Both demodulated measurement signal and setpoint cure are filtered with the aid of the same filter function. The filter function is operative to suppress noise signal components of the demodulated measurement signal that disturb both signal components of the demodulated measurement signal and the setpoint curve.
    Type: Application
    Filed: January 21, 2015
    Publication date: July 23, 2015
    Inventors: Ralf Bitter, Thomas Hankiewicz, Christoph Wolfgang Marquardt, Adrian Mucha, Jan Nygren, Kai-Uwe Pleban, Franz Steinbacher
  • Publication number: 20150089993
    Abstract: A method for measuring the concentration of a gas component in a measurement gas using a gas analyzer comprises varying the wavelength of the light of a wavelength-tunable light source within periodically consecutive scan intervals for wavelength-dependent scanning of a gas component absorption line of interest. The method also comprises modulating the wavelength of the light of the wavelength-tunable light source with a frequency, guiding the modulated light through the measurement gas onto a detector and demodulating a measurement signal generated by the detector in the event of a harmonic of the frequency. The method further comprises producing a measurement result by fitting a desired curve to the profile of the demodulated measurement signal. A function orthogonal to the desired curve is provided, and an orthogonal component of the measurement result is produced by fitting the orthogonal function to the profile of the demodulated measurement signal.
    Type: Application
    Filed: October 1, 2014
    Publication date: April 2, 2015
    Inventors: Ralf Bitter, Thomas Hankiewicz, Christoph Wolfgang Marquardt, Jan Nygren, Kai-Uwe Pleban, Franz Steinbacher
  • Publication number: 20150014541
    Abstract: A method for measuring the concentration of a gas component in a measuring gas, wherein a semiconductor laser is periodically actuated by a current ramp to scan a selected absorption line in a wavelength-dependent manner and to determine the concentration of the gas component based on the reduction in the light intensity as a result of the absorption of the light at the location of the absorption line.
    Type: Application
    Filed: July 7, 2014
    Publication date: January 15, 2015
    Inventors: Daniel Depenheuer, Christoph Wolfgang Marquardt