Abstract: Methods, structures, and apparatus that limit the amount of dendritic growth and metal migration between contacts in order to prevent an erroneous detection of a connection and/or functional failure. One example may reduce dendritic growth and metal migration by limiting an amount of time that a connection detection voltage is applied to CC contacts of a USB Type-C connector when an electronic device is detecting a connection. This and other examples may further limit dendritic growth by not applying the connection detection voltage to the CC contacts for a first duration following a detection of a disconnection.

Abstract: Methods, structures, and apparatus that limit the amount of dendritic growth and metal migration between contacts in order to prevent an erroneous detection of a connection and/or functional failure. One example may reduce dendritic growth and metal migration by limiting an amount of time that a connection detection voltage is applied to CC contacts of a USB Type-C connector when an electronic device is detecting a connection. This and other examples may further limit dendritic growth by not applying the connection detection voltage to the CC contacts for a first duration following a detection of a disconnection.