Patents by Inventor Christophe Francois

Christophe Francois has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20030129811
    Abstract: A method is disclosed for depositing silicon with high deposition rates and good step coverage. The process is performed at high pressures, including close to atmospheric pressures, at temperatures of greater than about 650° C. Silane and hydrogen are flowed over a substrate in a single-wafer chamber. Advantageously, the process maintains good step coverage and high deposition rates (e.g., greater that 50 nn/min) even when dopant gases are added to the process, resulting in commercially practicable rates of deposition for conductive silicon. Despite the high deposition rates, step coverage is sufficient to deposit polysilicon into extremely deep trenches and vias with aspect ratios as high as 40:1, filling such structures without forming voids or keyholes.
    Type: Application
    Filed: January 16, 2003
    Publication date: July 10, 2003
    Inventors: Ivo Raaijmakers, Christophe Francois Lilian Pomarede, Cornelius Alexander van der Jeugd, Alexander Gschwandtner, Andres Grassi
  • Publication number: 20030091577
    Abstract: Novel protein antigens from Streptococcus pneumoniae are disclosed, together with nucleic acid sequences encoding them. Their use in vaccines and in screening methods is also described.
    Type: Application
    Filed: January 26, 2001
    Publication date: May 15, 2003
    Inventors: Christophe Francois Guy Gilbert, Philip Michael Hansbro
  • Publication number: 20010020712
    Abstract: A method is disclosed for depositing silicon with high deposition rates and good step coverage. The process is performed at high pressures, including close to atmospheric pressures, at temperatures of greater than about 650° C. Silane and hydrogen are flowed over a substrate in a single-wafer chamber. Advantageously, the process maintains good step coverage and high deposition rates (e.g., greater that 50 nn/min) even when dopant gases are added to the process, resulting in commercially practicable rates of deposition for conductive silicon. Despite the high deposition rates, step coverage is sufficient to deposit polysilicon into extremely deep trenches and vias with aspect ratios as high as 40:1, filling such structures without forming voids or keyholes.
    Type: Application
    Filed: January 18, 2001
    Publication date: September 13, 2001
    Inventors: Ivo Raaijmakers, Christophe Francois Lillian Pomarede, Cornelius Alexander van der Jeugd, Alexander Gschwandiner, Andres Grassi