Abstract: Disclosed is a calibration system and method for a phased array ultrasound pipe inspection system, in which reliable calibration is obtained for notches at all angles using only a small number of notches for the calibration. The method comprises a one-time normalization step and a system calibration step which may be performed at regular intervals. Ultrasound transmission is in a single diverging beam for each aperture, while reception is selective for multiple well-defined reception angles. During the normalization step, plots of maximum response vs reception angle are plotted for each notch, and a normalization curve is constructed by fitting the maxima of these plots. The normalization curve is used to derive calibration targets at specific reception angles for specific calibration notches, which are then used for the system calibrations.

Abstract: Disclosed is a calibration system and method for a phased array ultrasound pipe inspection system, in which reliable calibration is obtained for notches at all angles using only a small number of notches for the calibration. The method comprises a one-time normalization step and a system calibration step which may be performed at regular intervals. Ultrasound transmission is in a single diverging beam for each aperture, while reception is selective for multiple well-defined reception angles. During the normalization step, plots of maximum response vs reception angle are plotted for each notch, and a normalization curve is constructed by fitting the maxima of these plots. The normalization curve is used to derive calibration targets at specific reception angles for specific calibration notches, which are then used for the system calibrations.

Abstract: A phased array system and the inspection method which is configured to inspect the weld seam of an HSAW for all standard types of flaws located both near pipe's internal and external surfaces in one scan pass, diminishing the need of making mechanical adjustment for the probes during the one pass of scan. The configuration includes the usage of at least one linear PA probe for Lamination inspection right above HAZ zone, at least one pair of PA probes for longitudinal defects inspection and holes detection and at least two pairs of PA probes for transversal defect inspections.

Abstract: A device is disclosed for performing non-destructive inspection and testing (NDT/NDI) of an elongated test object, wherein the inspection system includes: a test object conveyor for conveying the test object along a longitudinal conveyance path; a probe assembly including phased-array probes, the probe assembly being configured to induce signals in the test object and sense echoes reflected from the test object; a probe assembly conveyor configured to movably support the probe assembly, to move the probe assembly on a circumferential path about the test object; and a control system coupled to the test object conveyor and to the probe assembly conveyor and configured to allow data acquisition by and from the phased-array probes while, simultaneously, the test object moves along the longitudinal path and the phased-array probes move on the circumferential path.

Abstract: A phased array system and the inspection method which is configured to inspect the weld seam of an HSAW for all standard types of flaws located both near pipe's internal and external surfaces in one scan pass, diminishing the need of making mechanical adjustment for the probes during the one pass of scan. The configuration includes the usage of at least one linear PA probe for Lamination inspection right above HAZ zone, at least one pair of PA probes for longitudinal defects inspection and holes detection and at least two pairs of PA probes for transversal defect inspections.

Abstract: A device is disclosed for performing non-destructive inspection and testing (NDT/NDI) of an elongated test object, wherein the inspection system includes: a test object conveyor for conveying the test object along a longitudinal conveyance path; a probe assembly including phased-array probes, the probe assembly being configured to induce signals in the test object and sense echoes reflected from the test object; a probe assembly conveyor configured to movably support the probe assembly, to move the probe assembly on a circumferential path about the test object; and a control system coupled to the test object conveyor and to the probe assembly conveyor and configured to allow data acquisition by and from the phased-array probes while, simultaneously, the test object moves along the longitudinal path and the phased-array probes move on the circumferential path.