Patents by Inventor Christopher A. Bone

Christopher A. Bone has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for data stackification for run-to-run control
    Patent number: 7181354
    Abstract: A method and an apparatus for organizing production data is provided. The method comprises performing at least one process run of semiconductor devices, and recording at least one manufacturing tag associated with the process run of semiconductor devices. The method further comprises performing metrology upon at least one process run of the semiconductor device for acquiring metrology data and for performing a metrology data stackification process upon the metrology data using the manufacturing tag for organizing and stacking the metrology data. The method further comprises modifying at least one control parameter is modified based upon the stacked metrology data.
    Type: Grant
    Filed: August 26, 2002
    Date of Patent: February 20, 2007
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Christopher A. Bone, Anthony J. Toprac
  • Method and apparatus for automated generation of test semiconductor wafers
    Patent number: 6647309
    Abstract: The present invention provides for a method and an apparatus for automated generation of test semiconductor wafers. At least one process run of semiconductor devices is performed. A determination is made whether an excursion of the process exists. An automated test wafer generation process is performed in response to the determination that an excursion of the process exists. A control parameter modification sequence is implemented in response to an examination of the test wafers.
    Type: Grant
    Filed: May 22, 2000
    Date of Patent: November 11, 2003
    Assignee: Advanced Micro Devices, Inc.
    Inventor: Christopher A. Bone
  • Method and apparatus for automatic routing for reentrant processes
    Patent number: 6529789
    Abstract: The present invention provides for a method and an apparatus for automatic routing of semiconductor devices within a manufacturing area. Performance of a plurality of manufacturing tools is tracked while processing semiconductor devices. At least one optimal combination of the manufacturing tools is determined based upon the tracked performance of the manufacturing tools. A queuing system is implemented to attain the optimal combination of the manufacturing tools. A dispatch system is deployed in response to the queuing system for routing the semiconductor devices within the manufacturing area.
    Type: Grant
    Filed: March 14, 2002
    Date of Patent: March 4, 2003
    Assignee: Advanced Micro Devices, Inc.
    Inventors: William Jarrett Campbell, Anthony J. Toprac, Christopher A. Bone
  • Method and apparatus for data stackification for run-to-run control
    Patent number: 6460002
    Abstract: In one embodiment, a method and apparatus is provided for data stackification for run-to-run control. A process run of semiconductor devices is processed. A manufacturing tag associated with the process run of semiconductor devices is recorded. Metrology data relating to the processed semiconductor devices is then acquired. The present invention calls for performing a metrology data stackification process upon the metrology data using the manufacturing tag for organizing and stacking the metrology data. The present invention provides for modifying at least one control parameter based upon the stacked metrology data.
    Type: Grant
    Filed: February 9, 2000
    Date of Patent: October 1, 2002
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Christopher A. Bone, Anthony J. Toprac
  • Method and apparatus for automatic routing for reentrant process
    Patent number: 6360133
    Abstract: The present invention provides for a method and an apparatus for automatic routing of semiconductor devices within a manufacturing area. Performance of a plurality of manufacturing tools is tracked while processing semiconductor devices. At least one optimal combination of the manufacturing tools is determined based upon the tracked performance of the manufacturing tools. A queuing system is implemented to attain the optimal combination of the manufacturing tools. A dispatch system is deployed in response to the queuing system for routing the semiconductor devices within the manufacturing area.
    Type: Grant
    Filed: June 17, 1999
    Date of Patent: March 19, 2002
    Assignee: Advanced Micro Devices, Inc.
    Inventors: William Jarrett Campbell, Anthony J. Toprac, Christopher A. Bone