Abstract: A photoplethysmographic system and method is provided to identify compatible sensors to monitors and/or for determining sensor attributes. The improved system includes a signal generation means for providing an interrogation signal, an identifying means coupled between a first and second sensor terminal operable to produce multiple outputs upon application of the interrogation signal in two modes of operation, and a processor to interpret the outputs. When the interrogation signal is applied to a sensor terminal in a first mode, a first output is obtained. Upon applying the same interrogation signal to the sensor terminal in a second mode, a second output is obtained. The first and second outputs may then be utilized by the processor comprising, for example, a photoplethysmographic monitor to yield enhanced sensor information. The disclosed method may be carried out utilizing the inventive photoplethysmographic system.

Abstract: A photoplethysmographic system and method is provided to identify compatible sensors to monitors and/or for determining sensor attributes. The improved system includes a signal generation means for providing an interrogation signal, an identifying means coupled between a first and second sensor terminal operable to produce multiple outputs upon application of the interrogation signal in two modes of operation, and a processor to interpret the outputs. When the interrogation signal is applied to a sensor terminal in a first mode, a first output is obtained. Upon applying the same interrogation signal to the sensor terminal in a second mode, a second output is obtained. The first and second outputs may then be utilized by the processor comprising, for example, a photoplethysmographic monitor to yield enhanced sensor information. The disclosed method may be carried out utilizing the inventive photoplethysmographic system.