Patents by Inventor Christopher B. Lesher

Christopher B. Lesher has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Wafer-level gate stress testing
    Patent number: 9322870
    Abstract: A method of testing a semiconductor device includes forming a test circuit over a semiconductor substrate. The test circuit includes a plurality of interconnects electrically connected to a set of device structures supported by the semiconductor substrate. A test, such as a gate stress or leakage current test, of each device structure is conducted with the test circuit. The plurality of interconnects are removed after conducting the test.
    Type: Grant
    Filed: September 3, 2013
    Date of Patent: April 26, 2016
    Assignee: Freescale Semiconductor, Inc.
    Inventors: William E. Edwards, Randall C. Gray, Christopher B. Lesher
  • WAFER-LEVEL GATE STRESS TESTING
    Publication number: 20150067429
    Abstract: A method of testing a semiconductor device includes forming a test circuit over a semiconductor substrate. The test circuit includes a plurality of interconnects electrically connected to a set of device structures supported by the semiconductor substrate. A test, such as a gate stress or leakage current test, of each device structure is conducted with the test circuit. The plurality of interconnects are removed after conducting the test.
    Type: Application
    Filed: September 3, 2013
    Publication date: March 5, 2015
    Applicant: FREESCALE SEMICONDUCTOR, INC.
    Inventors: William E. Edwards, Randall C. Gray, Christopher B. Lesher