Abstract: Systems and methods are provided for generating a current. A first current source generates a first current based on a first current selection signal, and a second current source generates a second current that is a multiple of the first current in response to selection of the first current.

Abstract: A system and method for measuring integrated circuit processor power demand comprises calibrating one or more voltage controlled oscillators for use as ammeters, calibrating a calibration current source, wherein the calibration current source draws current through a inherent resistance, calibrating the inherent resistance, and interleaving said calibrations in time with calculating the processor power demand using a voltage that is measured across the inherent resistance.

Abstract: The present invention is directed to a system and method for measuring a current in an integrated circuit comprising measuring a first output count from a first voltage controlled oscillator (VCO) using a first measurement voltage, simultaneously measuring a second output count from a second VCO using a second measurement voltage, and calculating the current in the integrated circuit using a voltage proportional to a difference between the first and second output counts.

Abstract: A method for calibrating a voltage controlled oscillator (VCO) comprising applying a plurality of known voltages to the input of a VCO, monitoring, for each of the voltages, an output count from the VCO over a set interval, and storing the output counts for each voltage. Also disclosed is a system for calibrating a voltage controlled oscillator (VCO) comprising a plurality of known voltages, wherein the known voltage are connectable to the VCO, and a controller coupled to the output of the VCO, wherein the controller maintains a calibration table of VCO output counts for selected voltage inputs.

Abstract: An apparatus comprising an integrated circuit on a VLSI die, and an embedded micro-controller constructed on the VLSI die, the micro-controller adapted to monitor and control the VLSI environment to optimize the integrated circuit operation. Another embodiment of the invention is directed to a method for monitoring and controlling an integrated circuit comprising providing an embedded micro-controller on a same VLSI die as the integrated circuit, monitoring and controlling a VLSI environment of the integrated circuit with the embedded micro-controller.