Abstract: Systems and methods for detecting and using equipment location in a building management system are provided. Location information (e.g., GPS coordinates, altitude data, etc.) is measured by one or more measurement devices at a physical location of building equipment. The measured location information is used to automatically determine the physical location of the building equipment in or around a building. The location of the building equipment is integrated with an architectural model of a building served by the building equipment and a graphical visualization of the integrated model is generated. The location of the building equipment can be used to automatically associate the building equipment with other building equipment or with a building zone, to automatically generate control parameters and control algorithms, and/or to generate an augmented reality display of the building equipment in the building.

Abstract: A metrology system for measuring aspheric test objects by subaperture stitching. A wavefront-measuring gauge having a limited capture range of wavefront shapes collects partially overlapping subaperture measurements over the test object. A variable optical aberrator reshapes the measurement wavefront with between a limited number of the measurements to maintain the measurement wavefront within the capture range of the wavefront-measuring gauge. Various error compensators are incorporated into a stitching operation to manage residual errors associated with the use of the variable optical aberrator.

Abstract: A metrology system for measuring aspheric test objects by subaperture stitching. A wavefront-measuring gauge having a limited capture range of wavefront shapes collects partially overlapping subaperture measurements over the test object. A variable optical aberrator reshapes the measurement wavefront with between a limited number of the measurements to maintain the measurement wavefront within the capture range of the wavefront-measuring gauge. Various error compensators are incorporated into a stitching operation to manage residual errors associated with the use of the variable optical aberrator.

Abstract: An multiport, multi-wavelength optical switch having and array of angular beam-directing devices employs an anamorphic optical system that transforms a beam corresponding to a given wavelength of a given multi-wavelength input channel into a beam, at a plane of the angular beam-directing device array, having an elliptical Gaussian-beam waist in the angular-directing direction of the beam-directing device and in the orthogonal direction, with the waist in the angular-direction direction being larger than the waist in the orthogonal direction. Planar and non-planar emitter/receivers for use with the switch are disclosed.

Abstract: An optical fiber collimator (100) in an optical system, includes a pair of optical fibers (108) having emitting cleaved planes (112) to provide a substantially uniform angled side surface for forming a prescribed angle (101) relative to the optical axis (105) of the optical system. The pair of optical fibers (108) are disposed coplanarly in the object plane of the optical system for sharing the optical axis and separated from each other and from the optical axis on the same object plane. Optically coupled to the pair of fibers, a microlens (106) has a sloped rear surface (114) opposite a rotationally symmetric microlens surface (116) which bound a volume having a homogeneous index of refraction. The pair of fibers (108) are positioned near the focal plane containing the optical axis (105) of the microlens for the generation or reception of collimated beams at the prescribed angle (101) relative to the optical axis (105) of the microlens (106).