Abstract: An example test socket for a test system includes a receptacle to make electrical and mechanical connections to a device under test (DUT) and a lid to cover the DUT in the receptacle. The lid is controllable to open automatically to enable receipt of the DUT in the receptacle and, following receipt of the DUT, to close automatically to cover the DUT in the receptacle. Closing the lid applies force to the DUT to complete the electrical and mechanical connections between the test socket and the DUT.

Abstract: A modular building panel device is provided. The device is comprised of a plurality of panels, which may include but are not limited to wall panels, corner wall panels, floor panels, ceiling panels, and roof panels. Specific dimensions of one panel may correspond in specific ratios to specific dimensions of another panel, allowing the panels to be easily used to form a structure in a modular fashion that is more efficient. In addition, the dimension ratios of the panels allow the panels to be modular. Further, the dimensions of the panels allow the panels to be easily transported due to stackability and arrangement.

Abstract: An example test socket for a test system includes a receptacle to make electrical and mechanical connections to a device under test (DUT) and a lid to cover the DUT in the receptacle. The lid is controllable to open automatically to enable receipt of the DUT in the receptacle and, following receipt of the DUT, to close automatically to cover the DUT in the receptacle. Closing the lid applies force to the DUT to complete the electrical and mechanical connections between the test socket and the DUT.