Patents by Inventor Christopher Burak

Christopher Burak has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Methods of measuring moving objects and reducing exposure during wavefront measurements
    Patent number: 6547395
    Abstract: Metrology is performed using short, temporally resolved measurements in order to “freeze” the deformation of the object at a particular instant in time. The pulsed light beams are used to conduct metrology of moving objects and objects which are moved relative to the detector for measurement thereof. The motion may be translational, spiral and/or rotational. The duty cycle of the light source may be varied to in accordance with the control of the operation of the detector to perform metrology using a reduced total exposure of an object, while increasing the amount of light available for the measurement.
    Type: Grant
    Filed: February 22, 2000
    Date of Patent: April 15, 2003
    Assignee: WaveFront Sciences, Inc.
    Inventors: Daniel R. Neal, Christopher Burak, Daniel R. Hamrick