Patents by Inventor Christopher C. Buckholtz

Christopher C. Buckholtz has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and device to clean probes
    Patent number: 7306849
    Abstract: A probe cleaning system automatically detects a surface of a probe cleaning device during a cleaning process by providing a predetermined finish on the surface of the probe cleaning device. The predetermined finish can include a textured or machined finish or a marking, such that the predetermined finish provides contrast against the surface. Cameras in the system automatically focus on the surface, with the predetermined finish. This in-focus condition is related to a distance between probes and the surface. Once an in-focus condition is determined, the system performs an automated cleaning process by interacting the probes with the probe cleaning device.
    Type: Grant
    Filed: July 1, 2002
    Date of Patent: December 11, 2007
    Assignee: FormFactor, Inc.
    Inventors: Christopher C. Buckholtz, Eric T. Watje
  • Apparatus and method for cleaning test probes
    Patent number: 6840374
    Abstract: A probe cleaning apparatus for cleaning a probe tip use to test semiconductors dies having an abrasive substrate layer an a tacky gel layer on top of the abrasive surface of the abrasive substrate layer. The probe tip is cleaned by passing it through the tacky gel layer so that it comes in contact with the abrasive surface of the abrasive substrate, moving the probe tip across the abrasive surface of the substrate layer, and then removing the probe tip from the successive layers of the cleaning apparatus. The probe tip emerges from the cleaning apparatus free from debris associated with testing the semiconductor dies.
    Type: Grant
    Filed: January 18, 2002
    Date of Patent: January 11, 2005
    Inventors: Igor Y. Khandros, Benjamin N. Eldridge, Treliant Fang, Gaetan L. Mathieu, Gary W. Grube, Michael A. Drush, Christopher C. Buckholtz
  • Method and device to clean probes
    Publication number: 20040000325
    Abstract: A probe cleaning system automatically detects a surface of a probe cleaning device during a cleaning process by providing a predetermined finish on the surface of the probe cleaning device. The predetermined finish can include a textured or machined finish or a marking, such that the predetermined finish provides contrast against the surface. Cameras in the system automatically focus on the surface, with the predetermined finish. This in-focus condition is related to a distance between probes and the surface. Once an in-focus condition is determined, the system performs an automated cleaning process by interacting the probes with the probe cleaning device.
    Type: Application
    Filed: July 1, 2002
    Publication date: January 1, 2004
    Inventors: Christopher C. Buckholtz, Eric T. Watje
  • Apparatus and method for cleaning test probes
    Publication number: 20030138644
    Abstract: A probe cleaning apparatus for cleaning a probe tip use to test semiconductors dies having an abrasive substrate layer an a tacky gel layer on top of the abrasive surface of the abrasive substrate layer. The probe tip is cleaned by passing it through the tacky gel layer so that it comes in contact with the abrasive surface of the abrasive substrate, moving the probe tip across the abrasive surface of the substrate layer, and then removing the probe tip from the successive layers of the cleaning apparatus. The probe tip emerges from the cleaning apparatus free from debris associated with testing the semiconductor dies.
    Type: Application
    Filed: January 18, 2002
    Publication date: July 24, 2003
    Inventors: Igor Y. Khandros, Benjamin N. Eldridge, Treliant Fang, Gaetan L. Mathieu, Gary W. Grube, Michael A. Drush, Christopher C. Buckholtz