Patents by Inventor Christopher Croft Jones

Christopher Croft Jones has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11899042
    Abstract: An example test system includes test sites comprising test sockets for testing devices under test (DUTs) and pickers for picking DUTs from the test sockets or placing the DUTs into the test sockets. Each picker may include a picker head for holding a DUT. The test system also includes a gantry on which the pickers are mounted. The gantry may be configured to move the pickers relative to the test sites to position the pickers for picking the DUTs from the test sockets or placing the DUTs into the test sockets. The test sockets are arranged in at least one array that is accessible to the pickers on the gantry.
    Type: Grant
    Filed: October 22, 2020
    Date of Patent: February 13, 2024
    Assignee: TERADYNE, INC.
    Inventors: Philip Luke Campbell, Adnan Khalid, Christopher Croft Jones, Christopher James Bruno
  • Patent number: 11867749
    Abstract: An example test system includes test sites that include sockets for testing devices under test (DUTs), pickers for picking DUTs from the sockets or placing the DUTs in the sockets, and a gantry on which the pickers are mounted. The gantry is configured to move the pickers relative to the test sites to position the pickers for picking the DUTs from the sockets or placing the DUTs into the sockets. The test system also includes one or more LASER range finders mounted on the gantry for movement over the DUTs in the sockets and in conjunction with movement of the pickers. A LASER range finder among the one or more LASER rangefinders mounted on the gantry is configured to detect a distance to a DUT placed into a socket.
    Type: Grant
    Filed: October 22, 2020
    Date of Patent: January 9, 2024
    Assignee: TERADYNE, INC.
    Inventors: Jianfa Pei, Adnan Khalid, Philip Luke Campbell, Christopher James Bruno, Christopher Croft Jones
  • Publication number: 20220128599
    Abstract: An example test system includes test sites comprising test sockets for testing devices under test (DUTs) and pickers for picking DUTs from the test sockets or placing the DUTs into the test sockets. Each picker may include a picker head for holding a DUT. The test system also includes a gantry on which the pickers are mounted. The gantry may be configured to move the pickers relative to the test sites to position the pickers for picking the DUTs from the test sockets or placing the DUTs into the test sockets. The test sockets are arranged in at least one array that is accessible to the pickers on the gantry.
    Type: Application
    Filed: October 22, 2020
    Publication date: April 28, 2022
    Inventors: Philip Luke Campbell, Adnan Khalid, Christopher Croft Jones, Christopher James Bruno
  • Publication number: 20220128622
    Abstract: An example test system includes test sites that include sockets for testing devices under test (DUTs), pickers for picking DUTs from the sockets or placing the DUTs in the sockets, and a gantry on which the pickers are mounted. The gantry is configured to move the pickers relative to the test sites to position the pickers for picking the DUTs from the sockets or placing the DUTs into the sockets. The test system also includes one or more LASER range finders mounted on the gantry for movement over the DUTs in the sockets and in conjunction with movement of the pickers. A LASER range finder among the one or more LASER rangefinders mounted on the gantry is configured to detect a distance to a DUT placed into a socket.
    Type: Application
    Filed: October 22, 2020
    Publication date: April 28, 2022
    Inventors: Jianfa Pei, Adnan Khalid, Philip Luke Campbell, Christopher James Bruno, Christopher Croft Jones