Abstract: A sensor system for measuring and locating parameters of a structure includes a robot configured to move between a first position and a second position along the structure. An inspection sensor is coupled to the robot and configured to measure a parameter associated with the structure. A localization sensor suite includes an inertial measurement unit and is configured to capture data associated with translational degrees of freedom and a rotational degree of freedom of the robot determined by the structure and an image capture system mounted to the robot. The image capture system acquires images of the structure. One or more processors is operatively connected to the localization sensor suite. The one or more processors is responsive to non-transitory executable computer instructions for generating a map of the route including features of the structure, the measured parameters, and a position of the robot relative to the structure.

Abstract: A sensor system for measuring and locating parameters of a structure includes a robot configured to move between a first position and a second position along the structure. An inspection sensor is coupled to the robot and configured to measure a parameter associated with the structure. A localization sensor suite includes an inertial measurement unit and is configured to capture data associated with translational degrees of freedom and a rotational degree of freedom of the robot determined by the structure and an image capture system mounted to the robot. The image capture system acquires images of the structure. One or more processors is operatively connected to the localization sensor suite. The one or more processors is responsive to non-transitory executable computer instructions for generating a map of the route including features of the structure, the measured parameters, and a position of the robot relative to the structure.