Patents by Inventor Christopher E. Hsiong

Christopher E. Hsiong has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8635566
    Abstract: A circuit design is simulated on a computing system. Simulating the circuit design includes selecting a first memory location in the circuit design in which to introduce a parity error according to the first memory location having a higher probability of being read than a second memory location of the circuit design. A parity error is inserted in the first memory location during simulation of the design.
    Type: Grant
    Filed: December 20, 2011
    Date of Patent: January 21, 2014
    Assignee: Advanced Micro Devices, Inc.
    Inventor: Christopher E. Hsiong
  • Publication number: 20130158973
    Abstract: A circuit design is simulated on a computing system. Simulating the circuit design includes selecting a first memory location in the circuit design in which to introduce a parity error according to the first memory location having a higher probability of being read than a second memory location of the circuit design. A parity error is inserted in the first memory location during simulation of the design.
    Type: Application
    Filed: December 20, 2011
    Publication date: June 20, 2013
    Inventor: Christopher E. Hsiong
  • Patent number: 8397200
    Abstract: A system for performing efficient continuous grading flow for test coverage analysis. The system provides for continuous test coverage grading. The continuous grading flow analyzes individual tests upon completion without requiring an entire set of tests to finish. As a result, the grading process at the end of the regression run is no longer necessary, disk space and memory requirements are dramatically reduced, and partial results are produced as the grading of individual tests complete, allowing engineers to track progress and make real-time decisions based on the intermediate results. The resource requirements of our continuous flow scale linearly with the number of tests rather than exponentially as with traditional approaches.
    Type: Grant
    Filed: June 29, 2010
    Date of Patent: March 12, 2013
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Christopher E. Hsiong, Lloyd C. Cha
  • Publication number: 20110320993
    Abstract: A system for performing efficient continuous grading flow for test coverage analysis. The system provides for continuous test coverage grading. The continuous grading flow analyzes individual tests upon completion without requiring an entire set of tests to finish. As a result, the grading process at the end of the regression run is no longer necessary, disk space and memory requirements are dramatically reduced, and partial results are produced as the grading of individual tests complete, allowing engineers to track progress and make real-time decisions based on the intermediate results. The resource requirements of our continuous flow scale linearly with the number of tests rather than exponentially as with traditional approaches.
    Type: Application
    Filed: June 29, 2010
    Publication date: December 29, 2011
    Inventors: Christopher E. Hsiong, Lloyd C. Cha