Patents by Inventor Christopher G. Fredericks

Christopher G. Fredericks has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Probabilistic detect identification
    Patent number: 10055276
    Abstract: A mechanism is provided for detecting one or more defects in an incoming log. One or more features are extracted from the incoming log. Utilizing the one or more features, one or more patterns, one or more pattern sequences of the one or more patterns, and one or more proximities associated with the one or more patterns contained in the incoming log are identified. For each defect model generated for the incoming log, a set of patterns in the defect model is compared to a set of patterns in each previously identified defect model in a set of previously identified defect models. Responsive to identifying a match and responsive to set of scores associated with the match meeting or exceeding a set of probability thresholds, an identification associated with the previously identified defect model along with any solution or workaround is passed to a support engineer.
    Type: Grant
    Filed: November 9, 2016
    Date of Patent: August 21, 2018
    Assignee: International Business Machines Corporation
    Inventors: Christopher G. Fredericks, Tien Hiong Lee, Konstantin Levinski, Xin Qian, Weng Sing Tang, Xiang Zhang
  • Probabilistic Detect Identification
    Publication number: 20180129549
    Abstract: A mechanism is provided for detecting one or more defects in an incoming log. One or more features are extracted from the incoming log. Utilizing the one or more features, one or more patterns, one or more pattern sequences of the one or more patterns, and one or more proximities associated with the one or more patterns contained in the incoming log are identified. For each defect model generated for the incoming log, a set of patterns in the defect model is compared to a set of patterns in each previously identified defect model in a set of previously identified defect models. Responsive to identifying a match and responsive to set of scores associated with the match meeting or exceeding a set of probability thresholds, an identification associated with the previously identified defect model along with any solution or workaround is passed to a support engineer.
    Type: Application
    Filed: November 9, 2016
    Publication date: May 10, 2018
    Inventors: Christopher G. Fredericks, Tien Hiong Lee, Konstantin Levinski, Xin Qian, Weng Sing Tang, Xiang Zhang