Abstract: Fluid supply systems are provided. Fluid supply systems of interest include an operating fluid line, a primary flushing fluid line, a secondary fluid line, a flow control circuit fluidically connected to the distal end of the primary flushing fluid line and the distal end of the secondary fluid line, and configured to selectively permit passage of a primary flushing fluid and a secondary fluid through an outlet, and a single fluidic connection configured to fluidically couple to the flow control circuit, the operating fluid line, and a fluidic component of an instrument. Methods of analyzing a sample and assembling an instrument are also provided.

Abstract: Fluid management systems for flow type particle analyzers are provided. Aspects of the fluid management systems include a flow cell comprising an input and output; a cuvette comprising an input coupled to the output of the flow cell and further comprising an output; a sample input line for fluidically coupling a sample fluid source to the input of the flow cell; and a fluid supply subsystem configured to alternatively fluidically couple: (a) a primary fluid source; or (b) one or more secondary fluid sources, to the input of the flow cell. Also provided are methods of using flow type particle analyzers having the subject fluid management systems.

Abstract: Aspects of the present disclosure include methods for determining drop delay of a particle in a flow stream (e.g., in a particle analyzer). Methods according to certain embodiments include irradiating the particle in the flow stream with two or more spatially separated lasers, detecting light from the particle in a first photodetector channel and a second photodetector channel calculating a velocity of the particle in the flow stream based on the detected light in the first photodetector channel and the second photodetector channel and determining the drop delay of the particle based on the calculated velocity. Systems (e.g., particle analyzers) having a light source with two or more spatially separated lasers and a light detection system for practicing the subject methods are also described. Integrated circuits and non-transitory computer readable storage medium having instructions stored thereon for determining drop delay according to the subject methods are also provided.

Abstract: Flow rate and vacuum controlled fluid management systems for flow type particle analyzers, such as flow cytometers, are provided. Aspects of the fluid management systems include a pump modulated sheath fluid subsystem and a vacuum modulated waste fluid subsystem. Also provided are methods of using flow type particle analyzers having fluid management systems of the invention, e.g., in particle analysis applications.