Patents by Inventor Christopher J. Farral

Christopher J. Farral has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6526550
    Abstract: A system and method for analyzing a baseline geometry and, optionally, a modified geometry. The method can include generating a numerical representation of a baseline geometry having baseline elements identified with first identifiers or element identifiers, and then assigning second identifiers or analyzer identifiers to the elements. A selected characteristic of the geometry, such as structural loading, is analyzed with reference to the second or analyzer identifiers. At least one of the elements of the geometry can then be altered in a manner that at least partially automatically adjusts the surrounding geometry, and the same first identifier or element identifier is associated with the altered element as was associated with the baseline, unaltered element. The altered geometry can be analyzed with respect to a third identifier (or another analyzer identifier) and a correspondence between the identifiers, the baseline element, and the altered element can be established and maintained.
    Type: Grant
    Filed: September 29, 2000
    Date of Patent: February 25, 2003
    Assignee: General Electric Company
    Inventors: Bruce J. Badding, Christopher J. Farral, Linda J. Farral, George H. Ghanime, David M. Johnson, Govindarajan Rengarajan, Peter J. Röhl, Mullahalli V. Srinivas, Julia A. Wagener
  • Patent number: 6505326
    Abstract: A system and method for analyzing a baseline geometry and, optionally, a modified geometry. The method can include generating a numerical representation of a baseline geometry having baseline elements identified with first identifiers or element identifiers, and then assigning second identifiers or analyzer identifiers to the elements. Thermal characteristics of the geometry are analyzed with reference to the second or analyzer identifiers. The results of the thermal analysis can be provided as an input for a structural analysis of the baseline geometry. At least one of the elements of the geometry can then be altered in a manner that at least partially automatically adjusts the surrounding geometry, and the same first identifier or element identifier is associated with the altered element as was associated with the baseline, unaltered element.
    Type: Grant
    Filed: September 29, 2000
    Date of Patent: January 7, 2003
    Assignee: General Electric Company
    Inventors: Christopher J. Farral, Linda Farral, David M. Johnson, Mullahalli V. Srinivas