Patents by Inventor Christopher J. Roff

Christopher J. Roff has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Tuner characterization methods and apparatus
    Patent number: 8319504
    Abstract: Embodiments include methods and apparatus for characterizing a tuner. For a given tuner, a processing system is adapted to measure scattering parameters for a plurality of characterization points that are non-uniformly distributed across a Smith chart, and to store the scattering parameters in a tuner characterization file. Interpolation and extrapolation processes are performed to determine additional scattering parameters for a plurality of additional characterization points, which are also stored in the tuner characterization file.
    Type: Grant
    Filed: May 29, 2009
    Date of Patent: November 27, 2012
    Assignee: Freescale Semiconductor, Inc.
    Inventors: Christopher J. Roff, Basim H. Noori
  • TUNER CHARACTERIZATION METHODS AND APPARATUS
    Publication number: 20100301875
    Abstract: Embodiments include methods and apparatus for characterizing a tuner. For a given tuner, a processing system is adapted to measure scattering parameters for a plurality of characterization points that are non-uniformly distributed across a Smith chart, and to store the scattering parameters in a tuner characterization file. Interpolation and extrapolation processes are performed to determine additional scattering parameters for a plurality of additional characterization points, which are also stored in the tuner characterization file.
    Type: Application
    Filed: May 29, 2009
    Publication date: December 2, 2010
    Applicant: FREESCALE SEMICONDUCTOR, INC.
    Inventors: Christopher J. Roff, Basim H. Noori