Patents by Inventor Christopher K Sutton

Christopher K Sutton has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8446932
    Abstract: A waveform reconstruction system and method for using the same are disclosed. The system includes an RF down-converter that receives a signal and outputs a down-converted signal. A demodulator demodulates the down-converted signal to generate a recovered digital data stream. A pattern detector detects a predetermined pattern in the recovered digital data stream. A delay generator delays the down-converted signal and outputs a delayed copy thereof. A signal processing circuit combines the delayed copy with previously received delayed copies of the down-converted signal to reconstruct an averaged waveform from the plurality of delayed copies having the predetermined pattern.
    Type: Grant
    Filed: February 22, 2010
    Date of Patent: May 21, 2013
    Assignee: Agilent Technologies, Inc.
    Inventors: Christopher K. Sutton, Lawrence D. Bennett
  • Patent number: 8225152
    Abstract: A hierarchical test executive system comprising and including Procedure, Test, Measurement and Datapoint levels. A Procedure is an ordered list of Tests; a Test is a group of Measurements in a Procedure that share the same test algorithm, and thus the same software code; a Measurement is a configuration or setup for a Test, and provides parameters to a Test; and a Datapoint is a subset of a Measurement containing additional parameters that select a result when one Measurement generates multiple results. When initiated, the test executive system presents a list of models and the user selects a model to be tested. The program then uploads the test software corresponding to the selected model and presents a list and descriptions of Procedures to the user. The user selects one of the Procedures, and the program retrieves the selected procedure from the test software and expands it into Tests, Measurements and Datapoints as determined by the Procedure.
    Type: Grant
    Filed: May 9, 2002
    Date of Patent: July 17, 2012
    Assignee: Agilent Technologies, Inc.
    Inventor: Christopher K Sutton
  • Publication number: 20110206091
    Abstract: A waveform reconstruction system and method for using the same are disclosed. The system includes an RF down-converter that receives a signal and outputs a down-converted signal. A demodulator demodulates the down-converted signal to generate a recovered digital data stream. A pattern detector detects a predetermined pattern in the recovered digital data stream. A delay generator delays the down-converted signal and outputs a delayed copy thereof. A signal processing circuit combines the delayed copy with previously received delayed copies of the down-converted signal to reconstruct an averaged waveform from the plurality of delayed copies having the predetermined pattern.
    Type: Application
    Filed: February 22, 2010
    Publication date: August 25, 2011
    Inventors: Christopher K. Sutton, Lawrence D. Bennett
  • Patent number: 7286951
    Abstract: Disclosed is a product that provides a test executive program for controlling tests on a device under test that is separate and distinct from the test executive system. The product may be embodied in a media storing instructions that direct a processing unit to 1) perform an electronic test on the device under test, 2) provide an interface for communicating with an external system that is distinct from the test executive program, and for permitting the test system to be operated by the external system, 3) communicate with the external system, and 4) in response to signals generated by the external system, operate the test system. Other test executive methods and apparatus are also disclosed.
    Type: Grant
    Filed: May 9, 2002
    Date of Patent: October 23, 2007
    Assignee: Agilent Technologies, Inc.
    Inventor: Christopher K Sutton
  • Patent number: 7055138
    Abstract: An electronic test system with a multi-level tree structure for summarizing the results of the test. The levels of the tree correspond to the hierarchical levels in the execution of a test procedure. The highest level, or first level, represents the result for the whole test procedure. Level two represents the results of various tests. Level three represents the results of various measurements performed in a test, and level four represents the results for various datapoints for a given measurement. Preferably, each level in the tree structure is characterized by a graphical element. The graphical element provides the information on the status of the result at that level. In the tree structure, the results at a higher level are determined by summarizing the results at the adjacent sub-level.
    Type: Grant
    Filed: October 23, 2001
    Date of Patent: May 30, 2006
    Assignee: Agilent Technologies, Inc.
    Inventor: Christopher K Sutton
  • Patent number: 7050921
    Abstract: A test executive system that allows running of selected tests. A graphical user interface allows the user to run all tests, run marginal and failed tests, or to run only selected tests. When the “run selected tests” option is selected, check boxes appear on a procedure tree. Selected Procedures, Tests, Measurements and Datapoints may then be selected by checking on a box and deselected by checking the box a second time. A check appears in selected boxes. The brightness of a checked box indicates how many lower level items are checked. The selected Procedures, Tests, Measurements and Datapoints can be saved and recalled.
    Type: Grant
    Filed: April 23, 2002
    Date of Patent: May 23, 2006
    Assignee: Agilent Technologies, Inc.
    Inventor: Christopher K Sutton
  • Patent number: 7047442
    Abstract: An electronic test system that distinguishes erroneous and marginal results. The test system includes a memory and an electronic processor for controlling the execution of the test, obtaining test results and generating test results. The test results include a determination of whether the condition of the test datapoints is pass, fail, error or marginal, where pass indicates that the DUT has met a specification, fail indicates that the DUT has not met the specification, error indicates that the test system or interface to the DUT has failed, and marginal indicates that the system is marginally within specification. The test results are displayed on a graphical user interface. The test system provides the ability to control the progress of the test system based on the results. For example, the system can be programmed to stop on erroneous results, marginal results, failed results, combinations of the forgoing, or stop after each measurement.
    Type: Grant
    Filed: April 23, 2002
    Date of Patent: May 16, 2006
    Assignee: Agilent Technologies, Inc.
    Inventor: Christopher K Sutton
  • Patent number: 6839650
    Abstract: An electronic test system having an object oriented hierarchical infrastructure including classes that allow a test developer or a test user to design a desired electronic test system. The class relationships define the function of the electronic test system. Classes include a procedure class, a test class, a measurement class, a datapoint class, a parameter class, a DUT class, a test system class, a specification class, a run procedure class, a result class, a plug-in class, an exec class, a model class, a device class, a test system device class, a user menu item class, an application class, and a state class. These classes are implemented in a hierarchical structure in which a datapoint is a subset of a measurement, a measurement is a configuration for a test, a test is a group of measurements that share the same test algorithm, and a procedure is an ordered list of tests to be run, and includes a list of measurements and datapoints.
    Type: Grant
    Filed: November 19, 2001
    Date of Patent: January 4, 2005
    Assignee: Agilent Technologies, Inc.
    Inventors: Christopher K Sutton, William R Pritchard, Kirsten C Carlson, James Martin
  • Patent number: 6823272
    Abstract: An electronic test system with a progress window that enables the user to observe in one glance the progress and status of a test. The progress window is preferably comprised of graphical elements representing test results grouped along a progress axis representing the length of the test procedure. Each graphical element is preferably displayed as a bar, with the length of the bar perpendicular to the progress axis representing the value of the result. The specifications limits are represented by lines parallel to the progress axis. A line above the progress axis represents the upper specification limit and a line below the progress axis represents the lower specification limit. The bars are color coded to display the pass, fail and marginal status of the test.
    Type: Grant
    Filed: October 23, 2001
    Date of Patent: November 23, 2004
    Assignee: Agilent Technologies, Inc.
    Inventor: Christopher K Sutton
  • Patent number: 6807506
    Abstract: A test executive system for controlling a test upon a device under test that is distinct and separate from said test executive system. The test executive system provides interactive dialog boxes in the following manner. A signal that an event in a testing procedure occurs is received. A file storing testing information is retrieved responsive to the signal. The testing information includes directions for the user to perform an action required to continue the test. The test executive system includes a web browser and the test information may comprise a web page. The testing information is displayed along with at least one input option. An input is then received from the user. The input is then processed responsive to receiving said input.
    Type: Grant
    Filed: March 20, 2002
    Date of Patent: October 19, 2004
    Assignee: Agilent Technologies, Inc.
    Inventors: Christopher K Sutton, Richard Mills
  • Patent number: 6745140
    Abstract: An electronic test system with a test results view filter that enables the user to filter the test results of a test program according to their particular datapoint value status. The test results view filter is preferably comprised of graphical elements representing a plurality of test results view filter option buttons grouped together in said test results view filter. Each test result view filter option button is capable of filtering an entire test program for their respective datapoint value status and displaying said filtered datapoint value status. The test results view filter option buttons are selected from the group consisting of: all datapoint value status, failed datapoint value status, marginal datapoint value status, and selected datapoint value status.
    Type: Grant
    Filed: October 23, 2001
    Date of Patent: June 1, 2004
    Assignee: Agilent Technologies, Inc.
    Inventor: Christopher K. Sutton
  • Publication number: 20030212938
    Abstract: A hierarchical test executive system comprising and including Procedure, Test, Measurement and Datapoint levels. A Procedure is an ordered list of Tests; a Test is a group of Measurements in a Procedure that share the same test algorithm, and thus the same software code; a Measurement is a configuration or setup for a Test, and provides parameters to a Test; and a Datapoint is a subset of a Measurement containing additional parameters that select a result when one Measurement generates multiple results. When initiated, the test executive system presents a list of models and the user selects a model to be tested. The program then uploads the test software corresponding to the selected model and presents a list and descriptions of Procedures to the user. The user selects one of the Procedures, and the program retrieves the selected procedure from the test software and expands it into Tests, Measurements and Datapoints as determined by the Procedure.
    Type: Application
    Filed: May 9, 2002
    Publication date: November 13, 2003
    Inventor: Christopher K. Sutton
  • Publication number: 20030212522
    Abstract: A test executive program for performing tests on an electronic device. The electronic test program provides plug-ins to allow communication with other electronic devices. The electronic test program also provides an Active X-COM interface that allows the other electronic programs to control the test executive program.
    Type: Application
    Filed: May 9, 2002
    Publication date: November 13, 2003
    Inventor: Christopher K. Sutton
  • Publication number: 20030200483
    Abstract: An electronic test system that distinguishes erroneous and marginal results. The test system includes a memory and an electronic processor for controlling the execution of the test, obtaining test results and generating test results. The test results include a determination of whether the condition of the test datapoints is pass, fail, error or marginal, where pass indicates that the DUT has met a specification, fail indicates that the DUT has not met the specification, error indicates that the test system or interface to the DUT has failed, and marginal indicates that the system is marginally within specification. The test results are displayed on a graphical user interface. The test system provides the ability to control the progress of the test system based on the results. For example, the system can be programmed to stop on erroneous results, marginal results, failed results, combinations of the forgoing, or stop after each measurement.
    Type: Application
    Filed: April 23, 2002
    Publication date: October 23, 2003
    Inventor: Christopher K. Sutton
  • Publication number: 20030200049
    Abstract: A test executive system that allows running of selected tests. A graphical user interface allows the user to run all tests, run marginal and failed tests, or to run only selected tests. When the “run selected tests” option is selected, check boxes appear on a procedure tree. Selected Procedures, Tests, Measurements and Datapoints may then be selected by checking on a box and deselected by checking the box a second time. A check appears in selected boxes. The brightness of a checked box indicates how many lower level items are checked. The selected Procedures, Tests, Measurements and Datapoints can be saved and recalled.
    Type: Application
    Filed: April 23, 2002
    Publication date: October 23, 2003
    Inventor: Christopher K. Sutton
  • Publication number: 20030182075
    Abstract: A test executive system for controlling a test upon a device under test that is distinct and separate from said test executive system. The test executive system provides interactive dialog boxes in the following manner. A signal that an event in a testing procedure occurs is received. A file storing testing information is retrieved responsive to the signal. The testing information includes directions for the user to perform an action required to continue the test. The test executive system includes a web browser and the test information may comprise a web page. The testing information is displayed along with at least one input option. An input is then received from the user. The input is then processed responsive to receiving said input.
    Type: Application
    Filed: March 20, 2002
    Publication date: September 25, 2003
    Inventors: Christopher K. Sutton, Richard Mills
  • Publication number: 20030097233
    Abstract: An electronic test system having an object oriented hierarchical infrastructure including classes that allow a test developer or a test user to design a desired electronic test system. The class relationships define the function of the electronic test system. Classes include a procedure class, a test class, a measurement class, a datapoint class, a parameter class, a DUT class, a test system class, a specification class, a run procedure class, a result class, a plug-in class, an exec class, a model class, a device class, a test system device class, a user menu item class, an application class, and a state class. These classes are implemented in a hierarchical structure in which a datapoint is a subset of a measurement, a measurement is a configuration for a test, a test is a group of measurements that share the same test algorithm, and a procedure is an ordered list of tests to be run, and includes a list of measurements and datapoints.
    Type: Application
    Filed: November 19, 2001
    Publication date: May 22, 2003
    Inventors: Christopher K. Sutton, William R. Pritchard, Kirsten C. Carlson, James Martin
  • Publication number: 20030093718
    Abstract: An executive test system for testing an electronic device having selectable specifications. A user may select from multiple sets of specifications. The selected specification is then applied to test results and a display of the results of the application of the specification is shown.
    Type: Application
    Filed: November 15, 2001
    Publication date: May 15, 2003
    Inventor: Christopher K. Sutton
  • Publication number: 20030093728
    Abstract: An electronic test system with a tape recorder type graphical control interface that enables the user to control the execution of a test procedure. The control interface includes buttons that enable the user to abort the execution of a test, pause the execution of a test, restart a test, restart a particular measurement in a test, skip a measurement in a test, or skip completely a test. The control interface is displayed on the graphical user interface as icons or implemented as hardware where the control buttons are physical buttons incorporated in an input device, an output device, or a remote control device.
    Type: Application
    Filed: November 14, 2001
    Publication date: May 15, 2003
    Inventor: Christopher K. Sutton
  • Publication number: 20030079162
    Abstract: An electronic test system with a progress window that enables the user to observe in one glance the progress and status of a test. The progress window is preferably comprised of graphical elements representing test results grouped along a progress axis representing the length of the test procedure. Each graphical element is preferably displayed as a bar, with the length of the bar perpendicular to the progress axis representing the value of the result. The specifications limits are represented by lines parallel to the progress axis. A line above the progress axis represents the upper specification limit and a line below the progress axis represents the lower specification limit. The bars are color coded to display the pass, fail and marginal status of the test.
    Type: Application
    Filed: October 23, 2001
    Publication date: April 24, 2003
    Inventor: Christopher K. Sutton