Patents by Inventor Christopher Lee Parrish

Christopher Lee Parrish has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8099358
    Abstract: A method of quantifying the value added by an internal company credit rating system is described. The method includes determining an internal company credit rating for a plurality of securities. The internal company credit rating for the plurality of securities and an external credit research agency original credit rating for each of the securities are inputted in a ratings history database. Data representative of a change of the external credit research agency original credit rating for at least one security of the plurality of securities to a new credit rating is received. Responsive to the change, data representative of a current price of the at least one security and a benchmark price of the at least one security is received. At least one metric is calculated to determine a correlation between the internal company credit ratings and the new external credit research agency for each of the plurality of securities.
    Type: Grant
    Filed: April 13, 2010
    Date of Patent: January 17, 2012
    Assignee: Bank of America Corporation
    Inventors: Patrick James Condon, Vinay D. Deshmukh, Christopher Lee Parrish, Winnie W. Cheng, Erica L. Turner, Randall T. Royther
  • Publication number: 20100191670
    Abstract: A method of quantifying the value added by an internal company credit rating system is described. The method includes determining an internal company credit rating for a plurality of securities. The internal company credit rating for the plurality of securities and an external credit research agency original credit rating for each of the securities are inputted in a ratings history database. Data representative of a change of the external credit research agency original credit rating for at least one security of the plurality of securities to a new credit rating is received. Responsive to the change, data representative of a current price of the at least one security and a benchmark price of the at least one security is received. At least one metric is calculated to determine a correlation between the internal company credit ratings and the new external credit research agency for each of the plurality of securities.
    Type: Application
    Filed: April 13, 2010
    Publication date: July 29, 2010
    Applicant: Bank of America Corporation
    Inventors: Patrick James Condon, Vinay D. Deshmukh, Christopher Lee Parrish, Winnie W. Cheng, Erica L. Turner, Randall T. Royther
  • Patent number: 7720753
    Abstract: A method of quantifying the value added by an internal company credit rating system is described. The method includes determining an internal company credit rating for each of a plurality of securities. The internal company credit rating for each of the plurality of securities and an external credit research agency original credit rating for each of the securities are inputted in a ratings history database. Data representative of a change of the external credit research agency original credit rating for at least one security of the plurality of securities to a new credit rating is received. Responsive to the change, data representative of a current price of the at least one security and a benchmark price of the at least one security is received. At least one metric is calculated to determine the number of times the internal company credit ratings for each of the plurality of securities was correct.
    Type: Grant
    Filed: December 4, 2007
    Date of Patent: May 18, 2010
    Assignee: Bank of America Corporation
    Inventors: Patrick James Condon, Vinay D. Deshmukh, Christopher Lee Parrish, Winnie W. Cheng, Erica L. Turner, Randall T. Royther