Patents by Inventor Christopher M. Limbach

Christopher M. Limbach has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Systems and methods for measuring light beam scattering
    Patent number: 12504372
    Abstract: A system for measurement of light scattering from a test article includes a light emitting device, configured to emit a light beam onto the test article along light axis, a collection assembly configured to collect scattered light from the test article along a measurement axis that is oriented at a non-zero angle from the light axis, wherein the collection assembly includes a first angular spectral filter, and a second angular spectral filter spaced from the first angular spectral filter along the measurement axis, wherein a position or orientation of at least one of the first angular spectral filter and the second angular spectral is adjustable relative to the measurement axis.
    Type: Grant
    Filed: August 11, 2023
    Date of Patent: December 23, 2025
    Assignee: The Texas A&M University System
    Inventors: Junhwi Bak, Yue Wu, Richard Bryant Miles, Christopher M. Limbach
  • SYSTEMS AND METHODS FOR MEASURING LIGHT BEAM SCATTERING
    Publication number: 20240241049
    Abstract: A system for measurement of light scattering from a test article includes a light emitting device, configured to emit a light beam onto the test article along light axis, a collection assembly configured to collect scattered light from the test article along a measurement axis that is oriented at a non-zero angle from the light axis, wherein the collection assembly includes a first angular spectral filter, and a second angular spectral filter spaced from the first angular spectral filter along the measurement axis, wherein a position or orientation of at least one of the first angular spectral filter and the second angular spectral is adjustable relative to the measurement axis.
    Type: Application
    Filed: August 11, 2023
    Publication date: July 18, 2024
    Applicant: The Texas A&M University System
    Inventors: Junhwi Bak, Yue Wu, Richard Bryant Miles, Christopher M. Limbach
  • Portable particle spectrometer
    Patent number: 9482620
    Abstract: Methods and systems for characterizing particles in an aerosol are disclosed. A system includes a collection container that utilizes the principles of elutriation to collect particles of selected aerodynamic diameter ranges within a measurement region. A particle detector is used to detect and characterize particles that have settled into the measurement region.
    Type: Grant
    Filed: October 21, 2015
    Date of Patent: November 1, 2016
    Assignee: Colorado State University Research Foundation
    Inventors: John Volckens, Kimberly Anderson, David Leith, Mwangi T. Ndonga, Azer Yalin, Christopher M. Limbach
  • PORTABLE PARTICLE SPECTOMETER
    Publication number: 20160109349
    Abstract: Methods and systems for characterizing particles in an aerosol are disclosed. A system includes a collection container that utilizes the principles of elutriation to collect particles of selected aerodynamic diameter ranges within a measurement region. A particle detector is used to detect and characterize particles that have settled into the measurement region.
    Type: Application
    Filed: October 21, 2015
    Publication date: April 21, 2016
    Inventors: John Volckens, Kimberly Anderson, David Leith, Mwangi T. Ndonga, Azer Yalin, Christopher M. Limbach