Patents by Inventor Christopher P. Favazza

Christopher P. Favazza has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240135603
    Abstract: Metal artifacts are reduced in x-ray computed tomography (“CT”) images using a suitably trained neural network, such as a convolutional neural network (“CNN”). Virtual metal DATA objects are inserted to either the raw projection data or CT image data (e.g., from pre-procedural CT scans) to generate sets of matching artifact-corrupted and artifact-uncorrupted images, and a CNN, or other neural network, is trained to separate the contribution to each image pixel due to patient anatomy, metal object, or metal object-induced artifact. The contributions from metal object-induced artifacts can then be removed to generate a final, artifact-reduced image.
    Type: Application
    Filed: February 14, 2022
    Publication date: April 25, 2024
    Inventors: Christopher P. Favazza, Andrea Ferrero, Liqiang Ren
  • Patent number: 11058392
    Abstract: Systems and methods for correcting images acquired with an imaging system for measurement bias from non-stationary noise in model observers are described. A biased detectability index is estimated from signal present and signal absent condition images and an estimate of the bias from non-stationary noise is also estimated. This bias is then removed from the detectability index to provide an assessment of detectability of the imaging system.
    Type: Grant
    Filed: December 19, 2017
    Date of Patent: July 13, 2021
    Assignee: Mayo Foundation for Medical Education and Research
    Inventors: Kenneth A. Fetterly, Christopher P. Favazza
  • Publication number: 20190320996
    Abstract: Systems and methods for correcting images acquired with an imaging system for measurement bias from non-stationary noise in model observers are described. A biased detectability index is estimated from signal present and signal absent condition images and an estimate of the bias from non-stationary noise is also estimated. This bias is then removed from the detectability index to provide an assessment of detectability of the imaging system.
    Type: Application
    Filed: December 19, 2017
    Publication date: October 24, 2019
    Inventors: Kenneth A. Fetterly, Christopher P. Favazza