Patents by Inventor Christopher P. Lanni

Christopher P. Lanni has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of determining the x-ray limit of an ion gauge
    Patent number: 4302679
    Abstract: An ion gauge having a reduced "x-ray limit" and means for measuring that limit. The gauge comprises an ion gauge of the Bayard-Alpert type having a short collector and having means for varying the grid-collector voltage.The "x-ray limit" (i.e. the collector current resulting from x-rays striking the collector) may then be determined by the formula: ##EQU1## where: I.sub.x ="x-ray limit",I.sub.l and I.sub.h =the collector current at the lower and higher grid voltage respectively; and,.alpha.=the ratio of the collector current due to positive ions at the higher voltage to that at the lower voltage.
    Type: Grant
    Filed: August 7, 1979
    Date of Patent: November 24, 1981
    Assignee: The United States of America as represented by the United States Department of Energy
    Inventors: David Edwards, Jr., Christopher P. Lanni