Abstract: A computer is programmed to identify a number of groups of timing windows, each group including a victim timing window and one (or more) aggressor timing window(s), respectively for a victim net and one (or more) aggressor nets in an IC design. The computer automatically slides (i.e. shifts in time) the victim and aggressor timing windows as a group for each die, i.e. by a specific amount that is identical for all timing windows of an instance of a coupled stage in a die, but differs for other instances of the same coupled stage in other dies. Crosstalk analysis is then performed, using time-shifted timing windows which result from sliding, to identify overlapping victim and aggressor nets, followed by variation aware delay calculations to identify timing violations and timing critical nets, followed by revision of the IC design, which is eventually fabricated in a wafer of semiconductor material.

Abstract: A computer is programmed to identify a number of groups of timing windows, each group including a victim timing window and one (or more) aggressor timing window(s), respectively for a victim net and one (or more) aggressor nets in an IC design. The computer automatically slides (i.e. shifts in time) the victim and aggressor timing windows as a group for each die, i.e. by a specific amount that is identical for all timing windows of an instance of a coupled stage in a die, but differs for other instances of the same coupled stage in other dies. Crosstalk analysis is then performed, using time-shifted timing windows which result from sliding, to identify overlapping victim and aggressor nets, followed by variation aware delay calculations to identify timing violations and timing critical nets, followed by revision of the IC design, which is eventually fabricated in a wafer of semiconductor material.