Patents by Inventor Christopher Qualey

Christopher Qualey has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and method for calibrating a wafer handling robot and a wafer cassette
    Patent number: 8335589
    Abstract: A system and method is disclosed for calibrating a semiconductor wafer handling robot and a semiconductor wafer cassette. A robot blade boot is attached to a robot blade of the semiconductor handling robot. The robot blade boot decreases a value of tolerance for the robot blade to move between two semiconductor wafers in the semiconductor wafer cassette. In one embodiment the vertical tolerance is decreased to approximately twenty thousandths of an inch (0.020?) on a top and a bottom of the robot blade boot. The use of the robot blade boot makes the calibration steps more critical and precise. The robot blade boot is removed from the robot blade after the calibration process has been completed.
    Type: Grant
    Filed: March 28, 2011
    Date of Patent: December 18, 2012
    Assignee: National Semiconductor Corporation
    Inventors: Roger Sarver, Christopher Qualey
  • SYSTEM AND METHOD FOR CALIBRATING A WAFER HANDLING ROBOT AND A WAFER CASSETTE
    Publication number: 20110167892
    Abstract: A system and method is disclosed for calibrating a semiconductor wafer handling robot and a semiconductor wafer cassette. A robot blade boot is attached to a robot blade of the semiconductor handling robot. The robot blade boot decreases a value of tolerance for the robot blade to move between two semiconductor wafers in the semiconductor wafer cassette. In one embodiment the vertical tolerance is decreased to approximately twenty thousandths of an inch (0.020?) on a top and a bottom of the robot blade boot. The use of the robot blade boot makes the calibration steps more critical and precise. The robot blade boot is removed from the robot blade after the calibration process has been completed.
    Type: Application
    Filed: March 28, 2011
    Publication date: July 14, 2011
    Applicant: National Semiconductor Corporation
    Inventors: Roger Sarver, Christopher Qualey
  • System and method for calibrating a wafer handling robot and a wafer cassette
    Patent number: 7933685
    Abstract: A system and method is disclosed for calibrating a semiconductor wafer handling robot and a semiconductor wafer cassette. A robot blade boot is attached to a robot blade of the semiconductor handling robot. The robot blade boot decreases a value of tolerance for the robot blade to move between two semiconductor wafers in the semiconductor wafer cassette. In one embodiment the vertical tolerance is decreased to approximately twenty thousandths of an inch (0.020?) on a top and a bottom of the robot blade boot. The use of the robot blade boot makes the calibration steps more critical and precise. The robot blade boot is removed from the robot blade after the calibration process has been completed.
    Type: Grant
    Filed: January 10, 2006
    Date of Patent: April 26, 2011
    Assignee: National Semiconductor Corporation
    Inventors: Roger Sarver, Christopher Qualey