Abstract: A method for correlating driving behavior to wear on a vehicle may include identifying a driver of the vehicle and receiving signals generated by a number of sensors built into specific locations on the vehicle. The method may include determining a driving pattern associated with the driver, assessing wear on the vehicle due to one or more wear mechanisms, identifying a correlation between the driving pattern and the assessed wear on the vehicle, and transmitting information associated with the correlation between the driving pattern and the assessed wear on the vehicle.

Abstract: A method for assessing driving routes to mitigate wear on a vehicle may include determining a driving route traversed by a vehicle, the driving route including an origin and a destination. The method may include receiving signals generated by a number of sensors built into specific locations on the vehicle, the sensors including at least one vibration sensor. The method may include assessing wear on the vehicle due to one or more wear mechanisms based on the signals. The method may include identifying a correlation between the driving route and the assessed wear on the vehicle, transmitting information associated with the correlation between the driving route and the assessed wear on the vehicle, receiving a routing recommendation based on information about an alternate route, and displaying the routing recommendation.

Abstract: A glass structure for a vehicle includes an outer layer of glass and an inner layer of glass. The inner layer of glass is perforated by a plurality of holes and the outer layer of glass and the inner layer of glass are separated by a gap disposed between opposing surfaces of the outer layer of glass and the inner layer of glass. The glass structure provided herein may provide noise absorption and temperature insulation characteristics.

Abstract: Embodiments relate to built-in testing of an unused element on a chip. An aspect includes concurrently performing on a chip comprising a plurality of chip elements comprising a plurality of active elements, each active element enabled to perform a respective function, and at least one unused element that is disabled from performing the respective function and configured to be selectively enabled as an active element, the respective functions of the respective active elements and a built-in self test (BIST) test of the at least one unused element. Another aspect includes inputting an input test pattern to the unused element. Another aspect includes receiving an output test pattern based on the input test pattern from the unused element. Another aspect includes comparing the input test pattern to the output test pattern. Another aspect includes determining whether the unused element passed or failed the testing based on the comparison.

Abstract: Embodiments relate to built-in testing of an unused element on a chip. An aspect includes concurrently performing on a chip comprising a plurality of chip elements comprising a plurality of active elements, each active element enabled to perform a respective function, and at least one unused element that is disabled from performing the respective function and configured to be selectively enabled as an active element, the respective functions of the respective active elements and a built-in self test (BIST) test of the at least one unused element. Another aspect includes inputting an input test pattern to the unused element. Another aspect includes receiving an output test pattern based on the input test pattern from the unused element. Another aspect includes comparing the input test pattern to the output test pattern. Another aspect includes determining whether the unused element passed or failed the testing based on the comparison.

Abstract: Embodiments relate to built-in testing of an unused element on a chip. An aspect includes concurrently performing on a chip comprising a plurality of chip elements comprising a plurality of active elements, each active element enabled to perform a respective function, and at least one unused element that is disabled from performing the respective function and configured to be selectively enabled as an active element, the respective functions of the respective active elements and a built-in self test (BIST) test of the at least one unused element. Another aspect includes inputting an input test pattern to the unused element. Another aspect includes receiving an output test pattern based on the input test pattern from the unused element. Another aspect includes comparing the input test pattern to the output test pattern. Another aspect includes determining whether the unused element passed or failed the testing based on the comparison.

Abstract: Embodiments relate to built-in testing of an unused element on a chip. An aspect includes concurrently performing on a chip comprising a plurality of chip elements comprising a plurality of active elements, each active element enabled to perform a respective function, and at least one unused element that is disabled from performing the respective function and configured to be selectively enabled as an active element, the respective functions of the respective active elements and a built-in self test (BIST) test of the at least one unused element. Another aspect includes inputting an input test pattern to the unused element. Another aspect includes receiving an output test pattern based on the input test pattern from the unused element. Another aspect includes comparing the input test pattern to the output test pattern. Another aspect includes determining whether the unused element passed or failed the testing based on the comparison.

Abstract: The present invention provides an improved method for updating the settings of a processor or a processor core, respectively, concurrently to the operation of the respective processor system in which the processor or processor core, respectively, is running. This enables the insertion of new scan chain data and thus enabling the modification of the hardware characteristics of the processor.

Abstract: The present invention provides an improved method for updating the settings of a processor or a processor core, respectively, concurrently to the operation of the respective processor system in which the processor or processor core, respectively, is running. This enables the insertion of new scan chain data and thus enabling the modification of the hardware characteristics of the processor.

Abstract: Reassignment of a physical processor backing a logical processor is performed concurrently to the operation of the processor. The operating state of one physical processor is loaded on another physical processor, such that the logical processor is backed by a different physical processor. This reassignment is performed concurrent to processor operation and transparent to the operating system.

Abstract: Reassignment of a physical processor backing a logical processor is performed concurrently to the operation of the processor. The operating state of one physical processor is loaded on another physical processor, such that the logical processor is backed by a different physical processor. This reassignment is performed concurrent to processor operation and transparent to the operating system.

Abstract: Reassignment of a physical processor backing a logical processor is performed concurrently to the operation of the processor. The operating state of one physical processor is loaded on another physical processor, such that the logical processor is backed by a different physical processor. This reassignment is performed concurrent to processor operation and transparent to the operating system.

Abstract: Reassignment of a physical processor backing a logical processor is performed concurrently to the operation of the processor. The operating state of one physical processor is loaded on another physical processor, such that the logical processor is backed by a different physical processor. This reassignment is performed concurrent to processor operation and transparent to the operating system.

Abstract: Special millicode instructions accelerate the "inner loop" portion of a millicode routine to execute ESA/390 string instructions. Specifically, these millicode instructions are: Replicate Byte, Find Byte Equal, Find Byte Not Equal, Compare String Bytes instructions.