Abstract: A system and method for semiconductor identification chip read out is presented. A user uses a stand-alone handheld device to extract product data, which includes manufacturing process attributes, from a semiconductor device. The semiconductor device couples to the hand held device through a subset of pins, such as a power pin, a ground pin, a clock in pin, and a data out pin. When coupled, the handheld device provides a clock signal to the semiconductor device. In turn, on chip logic within the semiconductor device detects the clock signal and gathers internal product data. Once gathered, the on chip logic provides the product data to the hand held device through the data out pin for a user to view. As a result, the user may track semiconductor devices more efficiently.

Abstract: A method, device, system, and computer program product for enabling advanced control of debugging processes on a JTAG (Joint Test Action Group) IEEE 1149.1 capable device (or system under test (SUT)). Middlesoft Commander is provided within a JTAG-enabled (or JTAG) POD, which is connected to both a host system executing debugging software and the SUT. The communication between the POD and the SUT is enabled with a pair of JTAG interfaces bridging the connection between the POD and the SUT. Middlesoft Commander comprises code that enables Middlesoft Commander to convert high level commands (debug packets) received from (or generated by) the host system into JTAG commands. These JTAG commands are forwarded to the SUT. Middlesoft Commander further comprises code that enables Middlesoft Commander to convert the JTAG data received from the SUT into commands recognizable by the host system.

Abstract: A method, apparatus and computer-usable medium are presented for dynamically selecting a clock signal used by a peripheral device that is coupled to a motherboard. When the motherboard is powered off, a clock selector sends the peripheral device an internal clock signal from the peripheral device's own internal clock controller. When the motherboard powers up, the clock selector sends the peripheral device an external clock signal from the motherboard.

Abstract: A system and method for semiconductor identification chip read out is presented. A user uses a stand-alone handheld device to extract product data, which includes manufacturing process attributes, from a semiconductor device. The semiconductor device couples to the hand held device through a subset of pins, such as a power pin, a ground pin, a clock in pin, and a data out pin. When coupled, the handheld device provides a clock signal to the semiconductor device. In turn, on chip logic within the semiconductor device detects the clock signal and gathers internal product data. Once gathered, the on chip logic provides the product data to the hand held device through the data out pin for a user to view. As a result, the user may track semiconductor devices more efficiently.

Abstract: A method, apparatus and computer-usable medium are presented for dynamically selecting a clock signal used by a peripheral device that is coupled to a motherboard. When the motherboard is powered off, a clock selector sends the peripheral device an internal clock signal from the peripheral device's own internal clock controller. When the motherboard powers up, the clock selector sends the peripheral device an external clock signal from the motherboard.

Abstract: A method, apparatus and computer-usable medium are presented for dynamically selecting a clock signal used by a peripheral device that is coupled to a motherboard. When the motherboard is powered off, a clock selector sends the peripheral device an internal clock signal from the peripheral device's own internal clock controller. When the motherboard powers up, the clock selector sends the peripheral device an external clock signal from the motherboard.

Abstract: A system for integrating multiple electrical system testing functions into a single peripheral component interconnect (PCI) card. The functions of system bring-up and debug are integrated into a single PCI card, which utilizes an operating system and a set of industry standard interfaces to interconnect with standard lab instrumentation. The integrated PCI card utilizes an embedded high performance microprocessor and a compact operating system to provide control over: system-under-test (SUT) power on/off; system device sequencing via programmable General Purpose Input/Output (GPIO); system parametric control (e.g. voltage, temperature, and frequency); system parametric measurement; system debug; and remote control operation via internet interface. In one embodiment, the integrated PCI card comprises the instrumentation controller, Joint Test Action Group (JTAG) Debugger, SUT system controller, and a computer-controlled GPIO card in a single, self aware, half-slot PCI card.

Abstract: A method, device, system, and computer program product for enabling advanced control of debugging processes on a JTAG (Joint Test Action Group) IEEE 1149.1 capable device (or system under test (SUT)). Middlesoft Commander is provided within a JTAG-enabled (or JTAG) POD, which is connected to both a host system executing debugging software and the SUT. The communication between the POD and the SUT is enabled with a pair of JTAG interfaces bridging the connection between the POD and the SUT. Middlesoft Commander comprises code that enables Middlesoft Commander to convert high level commands (debug packets) received from (or generated by) the host system into JTAG commands. These JTAG commands are forwarded to the SUT. Middlesoft Commander further comprises code that enables Middlesoft Commander to convert the JTAG data received from the SUT into commands recognizable by the host system.