Patents by Inventor Christopher Stankus

Christopher Stankus has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20260142026
    Abstract: The disclosure provides a centralized operating room (OR) controller and associated components for an interoperable OR. The interoperable OR can be provisioned for a urological procedure. The centralized controller provides for interaction with each device in the OR and provides for configuration, monitoring, and control of the devices in a composite group or groups.
    Type: Application
    Filed: October 14, 2025
    Publication date: May 21, 2026
    Applicant: Boston Scientific Scimed, Inc.
    Inventors: Jeffrey A. Meganck, Niraj Prasad Rauniyar, Hernan Altman, Christopher Stankus
  • Publication number: 20260102206
    Abstract: The disclosure provides a method for closed loop control in a urological operating room comprising: receiving, at a single control device, real-time information from a plurality of therapy consoles provisioned in an operating theater; determining whether the received information is outside a predetermined threshold range; automatically generating control signals based on a determination that the received information is outside the predetermined threshold range; sending the control signals to at least one therapy console of the plurality of therapy consoles to adjust an operational parameter of the at least one therapy console and mitigate a deviation from the predetermined threshold range; receiving real-time feedback information from the plurality of therapy consoles; iteratively updating the control signals based on the real-time feedback information; and sending the updated control signals to automatically adjust an operational parameter of the at least one therapy console and mitigate a remaining deviatio
    Type: Application
    Filed: October 14, 2025
    Publication date: April 16, 2026
    Applicant: Boston Scientific Scimed, Inc.
    Inventors: Jeffrey A. Meganck, Niraj Prasad Rauniyar, Hernan Altman, Christopher Stankus
  • Publication number: 20260016527
    Abstract: A method for simulating failure testing of in-situ power grid hardware in real-time can include extracting, by one or more processors, parameters from power grid dynamics data to perform power grid simulation testing, sending, by the one or more processors, a reference to a power grid device, generating, by the one or more processors, stress information based on the reference via the power grid device to a power grid hardware, collecting, by the one or more processors, a response from the power grid hardware to the stress information, identifying, by the one or more processors, behaviors of the response, and extracting, by the one or more processors, a failure and aging model of the power grid hardware.
    Type: Application
    Filed: May 14, 2025
    Publication date: January 15, 2026
    Applicant: UCHICAGO ARGONNE, LLC
    Inventors: Moinuddin AHMED, Zhenghong TU, Christopher STANKUS
  • Patent number: 11493548
    Abstract: A method for predicting failure parameters of semiconductor devices can include receiving a set of data that includes (i) characteristics of a sample semiconductor device, and (ii) parameters characterizing a stress condition. The method further includes extracting a plurality of feature values from the set of data and inputting the plurality of feature values into a trained model executing on the one or more processors, wherein the trained model is configured according to an artificial intelligence (AI) algorithm based on a previous plurality of feature values, and wherein the trained model is operable to output a failure prediction based on the plurality of feature values. Further, the method includes generating, via the trained model, a predicted failure parameter of the sample semiconductor device due to the stress condition.
    Type: Grant
    Filed: July 23, 2021
    Date of Patent: November 8, 2022
    Assignee: UCHICAGO ARGONNE, LLC
    Inventors: Moinuddin Ahmed, John N. Hryn, Christopher Stankus
  • Publication number: 20220065919
    Abstract: A method for predicting failure parameters of semiconductor devices can include receiving a set of data that includes (i) characteristics of a sample semiconductor device, and (ii) parameters characterizing a stress condition. The method further includes extracting a plurality of feature values from the set of data and inputting the plurality of feature values into a trained model executing on the one or more processors, wherein the trained model is configured according to an artificial intelligence (AI) algorithm based on a previous plurality of feature values, and wherein the trained model is operable to output a failure prediction based on the plurality of feature values. Further, the method includes generating, via the trained model, a predicted failure parameter of the sample semiconductor device due to the stress condition.
    Type: Application
    Filed: July 23, 2021
    Publication date: March 3, 2022
    Inventors: Moinuddin Ahmed, John N. Hryn, Christopher Stankus
  • Publication number: 20210106124
    Abstract: A carrying device has a lifting member with a first end, a second end, and a middle between its first and second ends. A spreading member has a first end and a second end, its first and second ends connected to the first and second ends of the lifting member. A first hanging member is adjacent to the first end of the spreading member and a second hanging member is adjacent to the second end of the spreading member. The lifting portion is adapted such that its middle portion hangs from a user's shoulder in order to facilitate carrying items hanging from the first and second hanging members.
    Type: Application
    Filed: October 8, 2020
    Publication date: April 15, 2021
    Inventors: Stephen F.W. Ball, JR., Christopher Stankus