Patents by Inventor Christopher W. Lindsey

Christopher W. Lindsey has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Workstation for integrating automated chemical analyzers
    Patent number: 6776961
    Abstract: A workstation for integrating two or more automated analyzers. The workstation includes a sample rack handler assembly, having a single common sample rack input area for loading sample racks for the two or more automated analyzers, and a sample rack bypass area for passing sample racks to be processed by one of the two or more automated analyzers. The workstation also includes a sample aliquoting assembly, having a sample pipetter station for aliquoting samples into aliquot vessels for processing by another one of the two or more automated analyzers. The workstation further includes an internal shuttle for shuttling the sample racks between the sample rack input area, the sample rack bypass area, and the sample pipetter station, and an external shuttle for shuttling the sample racks between the sample rack input area, the sample rack bypass area, and the one of the two or more automated analyzers.
    Type: Grant
    Filed: July 23, 2001
    Date of Patent: August 17, 2004
    Assignee: Beckman Coulter, Inc.
    Inventors: Christopher W. Lindsey, George K. Shibata, Songtai Tu, Steven D. Mack, Dang M. Ngo
  • Workstation for integrating automated chemical analyzers
    Publication number: 20020015665
    Abstract: A workstation for integrating two or more automated analyzers. The workstation includes a sample rack handler assembly, having a single common sample rack input area for loading sample racks for the two or more automated analyzers, and a sample rack bypass area for passing sample racks to be processed by one of the two or more automated analyzers. The workstation also includes a sample aliquoting assembly, having a sample pipetter station for aliquoting samples into aliquot vessels for processing by another one of the two or more automated analyzers. The workstation further includes an internal shuttle for shuttling the sample racks between the sample rack input area, the sample rack bypass area, and the sample pipetter station, and an external shuttle for shuttling the sample racks between the sample rack input area, the sample rack bypass area, and the one of the two or more automated analyzers.
    Type: Application
    Filed: July 23, 2001
    Publication date: February 7, 2002
    Inventors: Christopher W. Lindsey, George K. Shibata, Songtai Tu, Steven D. Mack, Dang M. Ngo