Abstract: An analytical instrument is disclosed that comprises an ion source having a sprayer that generates a spray within an enclosure. A gas flow system causes a flow of gas through the enclosure, filters sample from the flow of gas, and senses a flow rate of the flow of gas. A controller controls the gas flow system and/or the sprayer based on the sensed flow rate.

Abstract: An ion source is disclosed that comprises a positioning assembly that can position a sprayer with respect to an ion inlet. The ion source includes a first imaging device that can provide a first view of a position of the sprayer with respect to the ion inlet, and a second imaging device that can provide a second, different view of a position of the sprayer with respect to the ion inlet. The second view has a higher magnification than the first view.