Patents by Inventor Christy Lee She

Christy Lee She has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Calibrated measurement system and method
    Patent number: 10330767
    Abstract: A calibrated measurement circuit, with a first node, a second node, a circuit element coupled between the first node and the second node, and a reference circuit element. The calibrated measurement circuit also comprises circuitry for directing a first current and a second current between the first node and the second node and to the reference circuit element. The calibrated measurement circuit also comprises circuitry for measuring voltage across the circuit element in response to the first and second currents, and circuitry for measuring voltage across the reference circuit element in response to the first and second currents. A calibration factor is also determined for calibrating measured voltages across the circuit element, in response to a relationship between the first voltage, the second voltage, and the reference circuit element.
    Type: Grant
    Filed: November 25, 2015
    Date of Patent: June 25, 2019
    Assignee: TEXAS INSTRUMENTS INCORPORATED
    Inventors: Abhijit Kumar Das, Christy Lee She
  • CALIBRATED MEASUREMENT SYSTEM AND METHOD
    Publication number: 20170146633
    Abstract: A calibrated measurement circuit, with a first node, a second node, a circuit element coupled between the first node and the second node, and a reference circuit element. The calibrated measurement circuit also comprises circuitry for directing a first current and a second current between the first node and the second node and to the reference circuit element. The calibrated measurement circuit also comprises circuitry for measuring voltage across the circuit element in response to the first and second currents, and circuitry for measuring voltage across the reference circuit element in response to the first and second currents. A calibration factor is also determined for calibrating measured voltages across the circuit element, in response to a relationship between the first voltage, the second voltage, and the reference circuit element.
    Type: Application
    Filed: November 25, 2015
    Publication date: May 25, 2017
    Inventors: Abhijit Kumar Das, Christy Lee She