Patents by Inventor Chuan-Bang Wang

Chuan-Bang Wang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7782045
    Abstract: An exemplary multi-signal input testing apparatus (2) includes a testing table (20), a transfer table (21) slidably positioned on the testing table, and a pair of multi-signal input devices (25) arranged on the transfer table. Each multi-signal input device includes a pair of connect ends (251, 252). One of the connect ends includes a plurality of pinhole terminals for receiving various testing signals, and the other connect end includes a plurality of connectors for supplying the testing signals to a product to be tested. This means that several tests can be automatically performed by a same multi-signal input testing apparatus at any single testing station. This speeds the testing of the products, and helps promote the efficiency of the testing process. In addition, it can simplify the configuration of various testing equipment and save space. Furthermore, there is little or no need for manual work by operators.
    Type: Grant
    Filed: June 19, 2006
    Date of Patent: August 24, 2010
    Assignees: Innocom Technology (Shenzhen) Co., Ltd., Chimel Innolux Corporation
    Inventors: Chuan-Bang Wang, Yan-Kai Zhang, Yu-Ping Wu, Jun She
  • Patent number: 7525303
    Abstract: An automatic testing apparatus (200) includes a transmission floor (210), a board (220), a stopping unit (230), and a testing device (260) beside the transmission floor. The transmission floor includes a plurality of rollers (211) positioned at two sides thereof. The board positioned on the rollers includes an I/O (input/output) circuit (222) and a first connector (265) electrically connected to the I/O circuit. The testing device includes a second connector (225) matchable with the first connector. The I/O circuit is used to electrically connect to an electronic device to be tested, such as an LCD (280). The stopping unit is positioned at the transmission floor for stopping the board moving. An automatic testing method using the automatic testing apparatus for testing an electronic device is also provided. The efficiency of the automatic testing apparatus is high.
    Type: Grant
    Filed: June 12, 2006
    Date of Patent: April 28, 2009
    Assignees: Innocom Technology (Shenzhen) Co., Ltd., Innolux Display Corp.
    Inventors: Chuan-Bang Wang, Yu-Ping Wu, Yan-Kai Zhang, Jun She
  • Publication number: 20060284641
    Abstract: An exemplary multi-signal input testing apparatus (2) includes a testing table (20), a transfer table (21) slidably positioned on the testing table, and a pair of multi-signal input devices (25) arranged on the transfer table. Each multi-signal input device includes a pair of connect ends (251, 252). One of the connect ends includes a plurality of pinhole terminals for receiving various testing signals, and the other connect end includes a plurality of connectors for supplying the testing signals to a product to be tested. This means that several tests can be automatically performed by a same multi-signal input testing apparatus at any single testing station. This speeds the testing of the products, and helps promote the efficiency of the testing process. In addition, it can simplify the configuration of various testing equipment and save space. Furthermore, there is little or no need for manual work by operators.
    Type: Application
    Filed: June 19, 2006
    Publication date: December 21, 2006
    Inventors: Chuan-Bang Wang, Yan-Kai Zhang, Yu-Ping Wu, Jun She
  • Publication number: 20060279307
    Abstract: An automatic testing apparatus (200) includes a transmission floor (210), a board (220), a stopping unit (230), and a testing device (260) beside the transmission floor. The transmission floor includes a plurality of rollers (211) positioned at two sides thereof. The board positioned on the rollers includes an I/O (input/output) circuit (222) and a first connector (265) electrically connected to the I/O circuit. The testing device includes a second connector (225) matchable with the first connector. The I/O circuit is used to electrically connect to an electronic device to be tested, such as an LCD (280). The stopping unit is positioned at the transmission floor for stopping the board moving. An automatic testing method using the automatic testing apparatus for testing an electronic device is also provided. The efficiency of the automatic testing apparatus is high.
    Type: Application
    Filed: June 12, 2006
    Publication date: December 14, 2006
    Inventors: Chuan-Bang Wang, Yu-Ping Wu, Yan-Kai Zhang, Jun She