Patents by Inventor Chuan Hua Chiu

Chuan Hua Chiu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and method for monitoring wafer furnace production efficiency
    Patent number: 7151975
    Abstract: A system for monitoring wafer throughput per hour in a wafer furnace includes a database, an analysis unit, a comparison unit, and an output unit. The database includes two or more operation histories of the wafer furnace. The analysis unit is coupled to the database. The analysis unit includes logic that retrieves at least one operation history from the database, determines a standard process time and a specification range for the retrieved operation history, and receives a current process time for the current process. The comparison unit, which is coupled to the analysis unit, includes logic that compares the standard process time and the specification range to the current process time. The output unit, which is coupled to the comparison unit, includes logic that outputs a comparison result. A method for monitoring wafer throughput per hour in a wafer furnace also is described.
    Type: Grant
    Filed: February 9, 2004
    Date of Patent: December 19, 2006
    Assignee: Macronix International Co., Ltd.
    Inventors: Topas Chang, Hsin Ten Wang, Chieh Chung Chang, Chuan Hua Chiu, Pei-Wei Kuo