Patents by Inventor Chuck Giddens

Chuck Giddens has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Application of statistical inference to optical time domain reflectometer data
    Patent number: 7605912
    Abstract: The present invention relates to a method for interpreting data obtained by measuring a length of optical fiber using an optical time domain reflectometer (OTDR), and comparing that measurement to a reference measurement. The technique uses statistical inference to determine a whether a reference trace is valid by comparing that trace to a more recent test trace. The reference trace may be replaced or an alarm may be transmitted under certain conditions.
    Type: Grant
    Filed: June 9, 2008
    Date of Patent: October 20, 2009
    Assignee: AT&T Corp
    Inventors: Michael Asher, Hossein Eslambolchi, Chuck Giddens, John Sinclair Huffman, Harold Stewart
  • Application of statistical inference to optical time domain reflectometer data
    Patent number: 7397545
    Abstract: The present invention relates to a method for interpreting data obtained by measuring a length of optical fiber using an optical time domain reflectometer (OTDR), and comparing that measurement to a reference measurement. The technique uses statistical inference to determine a whether a reference trace is valid by comparing that trace to a more recent test trace. The reference trace may be replaced or an alarm may be transmitted under certain conditions.
    Type: Grant
    Filed: July 16, 2007
    Date of Patent: July 8, 2008
    Assignee: AT&T Corp.
    Inventors: Michael Asher, Hossein Eslambolchi, Chuck Giddens, John Sinclair Huffman, Harold Stewart
  • Application of statistical inference to optical time domain reflectometer data
    Patent number: 7256878
    Abstract: The present invention relates to a method for interpreting data obtained by measuring a length of optical fiber using an optical time domain reflectometer (OTDR), and comparing that measurement to a reference measurement. The technique uses statistical inference to determine a whether a reference trace is valid by comparing that trace to a more recent test trace. One technique uses a chi-squared best fit of an array reflectance spike occurrences along the fiber to a historical reference array.
    Type: Grant
    Filed: May 15, 2006
    Date of Patent: August 14, 2007
    Assignee: AT&T Corp.
    Inventors: Michael Asher, Hossein Eslambolchi, Chuck Giddens, John Sinclair Huffman, Harold Stewart
  • Application of statistical inference to optical time domain reflectometer data
    Patent number: 7075632
    Abstract: The present invention relates to method for interpreting data obtained by measuring a length of optical fiber using an optical time domain reflectometer (OTDR), and comparing that measurement to a reference measurement. The technique uses statistical inference to determine a likely cause for a length measurement to be shorter than a reference length. One technique uses a chi-squared best fit of an array reflectance spike occurrences along the fiber to a historical reference array. In that way, it can be determined whether the missing portion of the tested fiber is at an end or between the ends, providing evidence that the short length measurement results from a fiber break or from the intentional removal of a reserve loop.
    Type: Grant
    Filed: October 31, 2005
    Date of Patent: July 11, 2006
    Inventors: Michael Asher, Hossein Eslambolchi, Chuck Giddens, John Sinclair Huffman, Harold Stewart
  • Application of statistical inference to optical time domain reflectometer data
    Patent number: 6989893
    Abstract: The present invention relates to method for interpreting data obtained by measuring a length of optical fiber using an optical time domain reflectometer (OTDR), and comparing that measurement to a reference measurement. The technique uses statistical inference to determine a likely cause for a length measurement to be shorter than a reference length. One technique uses a chi-squared best fit of an array reflectance spike occurrences along the fiber to a historical reference array. In that way, it can be determined whether the missing portion of the tested fiber is at an end or between the ends, providing evidence that the short length measurement results from a fiber break or from the intentional removal of a reserve loop.
    Type: Grant
    Filed: July 23, 2004
    Date of Patent: January 24, 2006
    Assignee: AT&T Corp.
    Inventors: Michael Asher, Hossein Eslambolchi, Chuck Giddens, John Sinclair Huffman, Harold Stewart