Patents by Inventor Chuhui Huang

Chuhui Huang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9366624
    Abstract: Disclosed is an apparatus for measuring turbidity, which includes a body case and includes a light source device, a light path absorption cell, a light path reception and detection module, a screen and a central processing unit, all of which are disposed on the body case. Spectrum of the light ray emitted by the light source device mainly has wavelengths in a range of 350 nm to 1000 nm. The spectrum has two peak wavelengths, one of which is in a range of 400 nm to 500 nm and has a half-peak width in a range of 5 nm to 50 nm, and the other of which is in a range of 550 nm to 750 nm and has a half-peak width in a range of 50 nm to 150 nm. Also disclosed is a method for rapidly measuring turbidity. By means of the present invention, turbidity of water sample can be measured accurately, simply, steadily and in high sensitivity.
    Type: Grant
    Filed: February 9, 2015
    Date of Patent: June 14, 2016
    Assignee: SHENZHEN SINSCHE TECHNOLOGY CO., LTD.
    Inventors: Xiaoping Huang, Dan Gao, Jianming Ruan, Chuhui Huang, Liping Hu
  • Publication number: 20150241343
    Abstract: Disclosed is an apparatus for measuring turbidity, which includes a body case and includes a light source device, a light path absorption cell, a light path reception and detection module, a screen and a central processing unit, all of which are disposed on the body case. Spectrum of the light ray emitted by the light source device mainly has wavelengths in a range of 350 nm to 1000 nm. The spectrum has two peak wavelengths, one of which is in a range of 400 nm to 500 nm and has a half-peak width in a range of 5 nm to 50 nm, and the other of which is in a range of 550 nm to 750 nm and has a half-peak width in a range of 50 nm to 150 nm. Also disclosed is a method for rapidly measuring turbidity. By means of the present invention, turbidity of water sample can be measured accurately, simply, steadily and in high sensitivity.
    Type: Application
    Filed: February 9, 2015
    Publication date: August 27, 2015
    Inventors: Xiaoping Huang, Dan Gao, Jianming Ruan, Chuhui Huang, Liping Hu