Patents by Inventor Chun-Chieh Chiu

Chun-Chieh Chiu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10497705
    Abstract: The present invention provides a bit line gate structure comprising a substrate, an amorphous silicon layer disposed on the substrate, a first doped region located in the amorphous silicon layer, a titanium silicon nitride (TiSiN) layer, located in the amorphous silicon layer, and a second doped region located in the TiSiN layer, the first doped region contacts the second doped region directly.
    Type: Grant
    Filed: May 6, 2018
    Date of Patent: December 3, 2019
    Assignees: UNITED MICROELECTRONICS CORP., Fujian Jinhua Integrated Circuit Co., Ltd.
    Inventors: Pin-Hong Chen, Yi-Wei Chen, Chun-Chieh Chiu, Chih-Chieh Tsai, Tzu-Chieh Chen, Chih-Chien Liu
  • Patent number: 10497617
    Abstract: A conductive structure includes a substrate including a first dielectric layer formed thereon, at least a first opening formed in the first dielectric layer, a low resistive layer formed in the opening, and a first metal bulk formed on the lower resistive layer in the opening. The first metal bulk directly contacts a surface of the first low resistive layer. The low resistive layer includes a carbonitride of a first metal material, and the first metal bulk includes the first metal material.
    Type: Grant
    Filed: December 19, 2018
    Date of Patent: December 3, 2019
    Assignee: UNITED MICROELECTRONICS CORP.
    Inventors: Li-Han Chen, Yen-Tsai Yi, Chun-Chieh Chiu, Min-Chuan Tsai, Wei-Chuan Tsai, Hsin-Fu Huang
  • Patent number: 10497607
    Abstract: A manufacturing method of an interconnect structure including the following steps is provided. A dielectric layer is formed on a silicon layer, wherein an opening exposing the silicon layer is in the dielectric layer. A metal layer is formed on the surface of the opening. A stress adjustment layer is formed on the metal layer. A thermal process is performed to react the metal layer with the silicon layer to form a metal silicide layer on the silicon layer. The stress adjustment layer is removed after the thermal process is performed. A barrier layer is formed on the surface of the opening.
    Type: Grant
    Filed: September 21, 2017
    Date of Patent: December 3, 2019
    Assignee: United Microelectronics Corp.
    Inventors: Li-Han Chen, Chun-Chieh Chiu, Wei-Chuan Tsai, Yen-Tsai Yi
  • Publication number: 20190353170
    Abstract: A method for controlling a fan in a fan start-up stage including a first time period and a second time period comprises the following steps of: during the first time period, continuously providing a first driving signal to drive the fan; and during the second time period, continuously providing a second driving signal to drive the fan; wherein, during the first time period the signal value (driving energy) of the first driving signal gradually decreases until being equal to the signal value of the second driving signal, and the signal value of the first driving signal is initially greater than the signal value of the second driving signal. A fan is also disclosed.
    Type: Application
    Filed: July 29, 2019
    Publication date: November 21, 2019
    Inventors: Yi-Fan LIN, Chung-Hung TANG, Cheng-Chieh LIU, Chun-Lung CHIU
  • Publication number: 20190341388
    Abstract: A method of forming a semiconductor memory device includes the following steps. First of all, a substrate is provided, and a plurality of gates is formed in the substrate, along a first direction. Next, a semiconductor layer is formed on the substrate, covering the gates, and a plug is then in the semiconductor layer, between two of the gates. Then, a deposition process is performed to from a stacked structure on the semiconductor layer. Finally, the stacked structure is patterned to form a plurality of bit lines, with one of the bit lines directly in contact with the plug.
    Type: Application
    Filed: June 7, 2018
    Publication date: November 7, 2019
    Inventors: Yi-Wei Chen, Hsu-Yang Wang, Chun-Chieh Chiu, Shih-Fang Tzou
  • Publication number: 20190319031
    Abstract: The present invention provides a bit line gate structure comprising a substrate, an amorphous silicon layer disposed on the substrate, a first doped region located in the amorphous silicon layer, a titanium silicon nitride (TiSiN) layer, located in the amorphous silicon layer, and a second doped region located in the TiSiN layer, the first doped region contacts the second doped region directly.
    Type: Application
    Filed: May 6, 2018
    Publication date: October 17, 2019
    Inventors: Pin-Hong Chen, Yi-Wei Chen, Chun-Chieh Chiu, Chih-Chieh Tsai, Tzu-Chieh Chen, Chih-Chien Liu
  • Publication number: 20190318933
    Abstract: A method for fabricating semiconductor device includes the steps of: forming a titanium nitride (TiN) layer on a silicon layer; performing a first treatment process by reacting the TiN layer with dichlorosilane (DCS) to form a titanium silicon nitride (TiSiN) layer; forming a conductive layer on the TiSiN layer; and patterning the conductive layer, the metal silicon nitride layer, and the silicon layer to form a gate structure.
    Type: Application
    Filed: May 22, 2018
    Publication date: October 17, 2019
    Inventors: Tzu-Hao Liu, Yi-Wei Chen, Tsun-Min Cheng, Kai-Jiun Chang, Chia-Chen Wu, Yi-An Huang, Po-Chih Wu, Pin-Hong Chen, Chun-Chieh Chiu, Tzu-Chieh Chen, Chih-Chien Liu, Chih-Chieh Tsai, Ji-Min Lin
  • Publication number: 20190319107
    Abstract: A method for fabricating semiconductor device includes the steps of first forming a silicon layer on a substrate and then forming a metal silicon nitride layer on the silicon layer, in which the metal silicon nitride layer includes a bottom portion, a middle portion, and a top portion and a concentration of silicon in the top portion is greater than a concentration of silicon in the middle portion. Next, a conductive layer is formed on the metal silicon nitride layer and the conductive layer, the metal silicon nitride layer, and the silicon layer are patterned to form a gate structure.
    Type: Application
    Filed: May 22, 2018
    Publication date: October 17, 2019
    Inventors: Chun-Chieh Chiu, Pin-Hong Chen, Yi-Wei Chen, Tsun-Min Cheng, Chih-Chien Liu, Tzu-Chieh Chen, Chih-Chieh Tsai, Kai-Jiun Chang, Yi-An Huang, Chia-Chen Wu, Tzu-Hao Liu
  • Publication number: 20190279022
    Abstract: An object recognition method and a device thereof are provided, the method includes: obtaining a plurality of key points of a test image and grayscale feature information of each of the key points, where the grayscale feature information is obtained according to a grayscale variation in the test image; obtaining hue feature information of each of the key points, where according to hue values of a plurality of adjacent pixels of the key point, the adjacent pixels are divided into a plurality of groups, and one of the groups is recorded as the hue feature information; and determining whether the test image is matched with a reference image according to the grayscale feature information and the hue feature information.
    Type: Application
    Filed: May 14, 2018
    Publication date: September 12, 2019
    Applicant: Chunghwa Picture Tubes, LTD.
    Inventors: Chun-Chieh Chiu, Hsiang-Tan Lin, Pei-Lin Hsieh
  • Publication number: 20190259906
    Abstract: A semiconductor light-emitting device comprises a substrate; a first adhesive layer on the substrate; multiple epitaxial units on the first adhesive layer; a second adhesive layer on the multiple epitaxial units; multiple first electrodes between the first adhesive layer and the multiple epitaxial units, and contacting the first adhesive layer and the multiple epitaxial units; and multiple second electrodes between the second adhesive layer and the multiple epitaxial units, and contacting the second adhesive layer and the multiple epitaxial units; wherein the multiple epitaxial units are totally separated.
    Type: Application
    Filed: May 7, 2019
    Publication date: August 22, 2019
    Inventors: Hsin-Chih Chiu, Chih-Chiang Lu, Chun-Yu Lin, Ching-Huai Ni, Yi-Ming Chen, Tzu-Chieh Hsu, Ching-Pei Lin
  • Publication number: 20190252390
    Abstract: A method of forming a bit line gate structure of a dynamic random access memory (DRAM) includes the following steps. A polysilicon layer is formed on a substrate. A sacrificial layer is formed on the polysilicon layer. An implantation process is performed on the sacrificial layer and the polysilicon layer. The sacrificial layer is removed. A metal stack is formed on the polysilicon layer. The present invention also provides another method of forming a bit line gate structure of a dynamic random access memory (DRAM) including the following steps. A polysilicon layer is formed on a substrate. A plasma doping process is performed on a surface of the polysilicon layer. A metal stack is formed on the surface of the polysilicon layer.
    Type: Application
    Filed: February 21, 2018
    Publication date: August 15, 2019
    Inventors: Yi-Wei Chen, Pin-Hong Chen, Tsun-Min Cheng, Chun-Chieh Chiu
  • Patent number: 10374051
    Abstract: A method for fabricating semiconductor device includes the steps of: forming a silicon layer on a substrate; forming a metal silicon nitride layer on the silicon layer; forming a stress layer on the metal silicon nitride layer; performing a thermal treatment process; removing the stress layer; forming a conductive layer on the metal silicon nitride layer; and patterning the conductive layer, the metal silicon nitride layer, and the silicon layer to form a gate structure.
    Type: Grant
    Filed: May 23, 2018
    Date of Patent: August 6, 2019
    Assignees: UNITED MICROELECTRONICS CORP., Fujian Jinhua Integrated Circuit Co., Ltd.
    Inventors: Ji-Min Lin, Yi-Wei Chen, Tsun-Min Cheng, Pin-Hong Chen, Chih-Chien Liu, Chun-Chieh Chiu, Tzu-Chieh Chen, Chih-Chieh Tsai, Yi-An Huang, Kai-Jiun Chang
  • Patent number: 10276389
    Abstract: A method for fabricating semiconductor device includes the steps of: forming a silicon layer on a substrate; forming a first metal silicon nitride layer on the silicon layer; performing an oxygen treatment process to form an oxide layer on the first metal silicon nitride layer; forming a second metal silicon nitride layer on the oxide layer; forming a conductive layer on the second metal silicon nitride layer; and patterning the conductive layer, the second metal silicon nitride layer, the oxide layer, the first metal silicon nitride layer, and the silicon layer to form a gate structure.
    Type: Grant
    Filed: May 23, 2018
    Date of Patent: April 30, 2019
    Assignees: UNITED MICROELECTRONICS CORP., Fujian Jinhua Integrated Circuit Co., Ltd.
    Inventors: Chih-Chieh Tsai, Yi-Wei Chen, Pin-Hong Chen, Chih-Chien Liu, Tzu-Chieh Chen, Chun-Chieh Chiu, Tsun-Min Cheng, Kai-Jiun Chang, Chia-Chen Wu, Yi-An Huang
  • Publication number: 20190122925
    Abstract: A conductive structure includes a substrate including a first dielectric layer formed thereon, at least a first opening formed in the first dielectric layer, a low resistive layer formed in the opening, and a first metal bulk formed on the lower resistive layer in the opening. The first metal bulk directly contacts a surface of the first low resistive layer. The low resistive layer includes a carbonitride of a first metal material, and the first metal bulk includes the first metal material.
    Type: Application
    Filed: December 19, 2018
    Publication date: April 25, 2019
    Inventors: Li-Han Chen, Yen-Tsai Yi, Chun-Chieh Chiu, Min-Chuan Tsai, Wei-Chuan Tsai, Hsin-Fu Huang
  • Publication number: 20190057895
    Abstract: A manufacturing method of an interconnect structure including the following steps is provided. A dielectric layer is formed on a silicon layer, wherein an opening exposing the silicon layer is in the dielectric layer. A metal layer is formed on the surface of the opening. A stress adjustment layer is formed on the metal layer. A thermal process is performed to react the metal layer with the silicon layer to form a metal silicide layer on the silicon layer. The stress adjustment layer is removed after the thermal process is performed. A barrier layer is formed on the surface of the opening.
    Type: Application
    Filed: September 21, 2017
    Publication date: February 21, 2019
    Applicant: United Microelectronics Corp.
    Inventors: Li-Han Chen, Chun-Chieh Chiu, Wei-Chuan Tsai, Yen-Tsai Yi
  • Patent number: 10199269
    Abstract: A conductive structure includes a substrate including a first dielectric layer formed thereon, at least a first opening formed in the first dielectric layer, a low resistive layer formed in the opening, and a first metal bulk formed on the lower resistive layer in the opening. The first metal bulk directly contacts a surface of the first low resistive layer. The low resistive layer includes a carbonitride of a first metal material, and the first metal bulk includes the first metal material.
    Type: Grant
    Filed: November 28, 2016
    Date of Patent: February 5, 2019
    Assignee: UNITED MICROELECTRONICS CORP.
    Inventors: Li-Han Chen, Yen-Tsai Yi, Chun-Chieh Chiu, Min-Chuan Tsai, Wei-Chuan Tsai, Hsin-Fu Huang
  • Publication number: 20180366368
    Abstract: The present invention provides a method for forming a contact structure, the method includes proving a substrate. An oxygen-containing dielectric layer is formed on the substrate. Next, a non-oxygen layer is formed on the oxygen-containing dielectric layer and a contact hole is then formed in the oxygen-containing dielectric layer. A metal layer is then formed in the contact hole and on the non-oxygen layer, with the non-oxygen layer disposed between the oxygen-containing dielectric layer and the metal layer. An anneal process is then performed to the metal layer, and a conductive layer is filled in the contact hole.
    Type: Application
    Filed: June 18, 2017
    Publication date: December 20, 2018
    Inventors: Chun-Chieh Chiu, Wei-Chuan Tsai, Yen-Tsai Yi, Li-Han Chen
  • Patent number: 10068797
    Abstract: A semiconductor process for forming a plug includes the following steps. A dielectric layer having a recess is formed on a substrate. A titanium layer is formed to conformally cover the recess. A first titanium nitride layer is formed to conformally cover the titanium layer, thereby the first titanium nitride layer having first sidewall parts. The first sidewall parts of the first titanium nitride layer are pulled back, thereby second sidewall parts being formed. A second titanium nitride layer is formed to cover the recess. Moreover, a semiconductor structure formed by said semiconductor process is also provided.
    Type: Grant
    Filed: May 3, 2017
    Date of Patent: September 4, 2018
    Assignee: UNITED MICROELECTRONICS CORP.
    Inventors: Pin-Hong Chen, Kuo-Chih Lai, Chia Chang Hsu, Chun-Chieh Chiu, Li-Han Chen, Shu Min Huang, Min-Chuan Tsai, Hsin-Fu Huang, Chi-Mao Hsu
  • Publication number: 20180151428
    Abstract: A conductive structure includes a substrate including a first dielectric layer formed thereon, at least a first opening formed in the first dielectric layer, a low resistive layer formed in the opening, and a first metal bulk formed on the lower resistive layer in the opening. The first metal bulk directly contacts a surface of the first low resistive layer. The low resistive layer includes a carbonitride of a first metal material, and the first metal bulk includes the first metal material.
    Type: Application
    Filed: November 28, 2016
    Publication date: May 31, 2018
    Inventors: Li-Han Chen, Yen-Tsai Yi, Chun-Chieh Chiu, Min-Chuan Tsai, Wei-Chuan Tsai, Hsin-Fu Huang
  • Patent number: 9985110
    Abstract: A semiconductor process is described. A silicon-phosphorus (SiP) epitaxial layer is formed serving as a source/drain (S/D) region. A crystalline metal silicide layer is formed directly on the SiP epitaxial layer and thus prevents oxidation of the SiP epitaxial layer. A contact plug is formed over the crystalline metal silicide layer.
    Type: Grant
    Filed: July 21, 2017
    Date of Patent: May 29, 2018
    Assignee: United Microelectronics Corp.
    Inventors: Pin-Hong Chen, Kuo-Chih Lai, Chia-Chang Hsu, Chun-Chieh Chiu, Li-Han Chen, Min-Chuan Tsai, Kuo-Chin Hung, Wei-Chuan Tsai, Hsin-Fu Huang, Chi-Mao Hsu