Abstract: A method of forming a semiconductor device includes: forming a semiconductor structure having source/drain regions, a fin disposed between the source/drain regions, and a dummy gate disposed on the fin and surrounded by a spacer; removing the dummy gate to form a gate trench which is defined by a trench-defining wall; forming a gate dielectric layer on the trench-defining wall; forming a work function structure on the gate dielectric layer; forming a resist layer to fill the gate trench; removing a top portion of the resist layer; removing the work function structure exposed from the resist layer using a wet chemical etchant; removing the resist layer; and forming a conductive gate in the gate trench.

Abstract: The present disclosure relates to a semiconductor device including a substrate having a top surface and a gate stack. The semiconductor device also includes a multi-spacer structure. The multi-spacer includes a first spacer formed on a sidewall of the gate stack, a second spacer, and a third spacer. The second spacer includes a first portion formed on a sidewall of the first spacer and a second portion formed on the top surface of the substrate. The second portion of the second spacer has a thickness in a first direction that gradually decreases. The third spacer is formed on the second portion of the second spacer and on the top surface of the substrate. The semiconductor device further includes a source/drain region formed in the substrate, and a portion of the third spacer abuts the source/drain region and the second portion of the second spacer.

Abstract: An electronic device includes a casing defining a first opening and a through hole, a first antenna, a first cover, and a camera module. The first antenna is mounted in the casing and whose position corresponds to the position of the first opening. The first cover is detachably fixed in the first opening and covering the first antenna. The camera module is mounted in the casing and includes a lens module received in the through hole for converging light incident thereon. The first antenna and the camera module are arranged in a first line, the first cover being fixed in the first opening is separated from the camera module by a first predetermined distance in a first direction parallel with the first line.

Abstract: An electronic apparatus includes a main body and a projection mechanism. The main body is used for providing video signals. The projection mechanism includes a built-in mini-projector that can either be stored in the electronic apparatus or extended out of the electronic apparatus for use. The mini-projector is capable of receiving video signals and projecting corresponding images when the projection mechanism is extended, and stops the projection of images when retracted.

Abstract: An electronic device includes a casing defining a first opening and a through hole, a first antenna, a first cover, and a camera module. The first antenna is mounted in the casing and whose position corresponds to the position of the first opening. The first cover is detachably fixed in the first opening and covering the first antenna. The camera module is mounted in the casing and includes a lens module received in the through hole for converging light incident thereon. The first antenna and the camera module are arranged in a first line, the first cover being fixed in the first opening is separated from the camera module by a first predetermined distance in a first direction parallel with the first line.

Abstract: An electronic apparatus includes a main body and a projection mechanism. The main body is used for providing video signals. The projection mechanism includes a built-in mini-projector that can either be stored in the electronic apparatus or extended out of the electronic apparatus for use. The mini-projector is capable of receiving video signals and projecting corresponding images when the projection mechanism is extended, and stops the projection of images when retracted.

Abstract: A power supply topology with pulse width modulation frequency control allows the use of an inductor with higher inductance in a converter. By controlling the switching frequency of the pulse width modulation signal, the inductor can achieve high efficiency during a light load condition and is also suitable for a heavy load condition.

Abstract: A method for using a single pin to support both power input and power control functions for an integrated circuit, wherein the integrated circuit is in communication with a system. The method includes receiving at the pin a power input signal from the system, generating a power control signal based on the power input signal through a control signal generating circuit, and sending the power control signal to the integrated circuit.

Abstract: A power supply topology with pulse width modulation frequency control allows the use of an inductor with higher inductance in a converter. By controlling the switching frequency of the pulse width modulation signal, the inductor can achieve high efficiency during a light load condition and is also suitable for a heavy load condition.

Abstract: The present invention provides a test card for multiple functions testing. The test card includes a host of media devices, all of which reside on a single printed circuit board; and a selection device which selects each one of the host of media devices for testing. The test card can test all SD, MMC, MS (Pro), SMC devices and functions in one time in a bench without inserting and removing the media devices, thus accelerates the production line test speed.

Abstract: A method for using a single pin to support both power input and power control functions for an integrated circuit, wherein the integrated circuit is in communication with a system. The method includes receiving at the pin a power input signal from the system, generating a power control signal based on the power input signal through a control signal generating circuit, and sending the power control signal to the integrated circuit.

Abstract: The present invention provides a test card for multiple functions testing. The test card includes a host of media devices, all of which reside on a single printed circuit board; and a selection device which selects each one of the host of media devices for testing. The test card can test all SD, MMC, MS (Pro), SMC devices and functions in one time in a bench without inserting and removing the media devices, thus accelerates the production line test speed.